Automatic Test Equipment
OwnerJochen Rueter, Simone Rehm +2inventors
InventorsJochen Rueter, Simone Rehm, Joerg-Walter Mohr, Frank Hensel
Life of this patent
Estimating the term…
Abstract
Embodiments of the present invention provide an automatic test equipment. The automatic test equipment is configured to receive an input signal from a device under test and to write an information describing the input signal to a memory. The automatic test equipment is further configured to read the information describing the input signal from the memory and to provide an output signal for the device under test based on the information describing the input signal read from the memory.
Claims20
An automatic test equipment,
- wherein the automatic test equipment is configured to receive an input signal from a device under test and to write an information describing the input signal to a memory;
- and
- wherein the automatic test equipment is configured to read the information describing the input signal from the memory and to provide an output signal for the device under test based on the information describing the input signal read from the memory;
- and
- wherein the device under test comprises a built in self test unit, wherein the automatic test equipment is coupled to the device under test to receive a signal provided by the built in self test unit as the input signal and to provide the output signal to the built in self test unit.
A method for testing a device under test comprising a built in self test unit, the method comprising:
- receiving an input signal from the device under test and writing an information describing the input signal to a memory;
- and
- reading the information describing the input signal from the memory and providing an output signal for the device under test based on the information describing the input signal read from the memory;
- wherein receiving the input signal comprises receiving a signal provided by the built in self test unit as the input signal;
- and
- wherein providing the output signal comprises providing the output signal to the built in self test unit of the device under test.
An apparatus for configuring an automatic test equipment,
- wherein the apparatus is adapted to configure the automatic test equipment to receive an input signal from a device under test and to write an information describing the input signal to a memory;
- and
- wherein the apparatus is adapted to configure the automatic test equipment to read the information describing the input signal from the memory and to provide an output signal for the device under test based on the information describing the input signal read from the memory;
- and
- wherein the device under test comprises a built in self test unit, wherein the automatic test equipment is coupled to the device under test to receive a signal provided by the built in self test unit as the input signal and to provide the output signal to the built in self test unit.
A method for configuring an automatic test equipment, the method comprising:
- configuring the automatic test equipment to receive an input signal from a device under test and to write an information describing the input signal to a memory;
- and
- configuring the automatic test equipment to read the information describing the input signal from the memory and to provide an output signal for the device under test based on the information describing the input signal read from the memory;
- wherein the device under test comprises a built in self test unit, wherein the automatic test equipment is coupled to the device under test to receive a signal provided by the built in self test unit as the input signal and to provide the output signal to the built in self test unit.
Dependencies are inferred from the claim text.