Autorecovery after manufacturing/system integration
AssigneeMicron Technology, Inc.
InventorsFrancesco Falanga, Victor Tsai
Life of this patent
Estimating the term…
Abstract
Testing methods in a pre-programmed memory device after it has been assembled into a final customer platform include issuing a self-test command to the memory device, the memory device reporting results of a self-test of pre-programmed data executed responsive to receiving the self-test command, and issuing a self-repair command responsive to the results indicating repair of the pre-programmed data is needed.
Claims31
A method for testing a pre-programmed memory device after it has been assembled into a final customer platform, the method comprising:
- issuing a self-test command to the memory device, wherein the memory device reports results of a self-test of pre-programmed data executed responsive to receiving the self-test command;
- and
- issuing a self-repair command responsive to the results indicating repair of the pre-programmed data is needed.
A method of testing a pre-programmed memory device after it has been assembled into a final customer platform, the method comprising:
- powering up the memory device;
- executing a host-initiated self-test or pre-programmed data at the memory device;
- and
- executing a self-repair of the pre-programmed data responsive to the self-test indicating repair is needed.
A memory device comprising:
- an array of memory cells;
- and
- memory control circuitry configured to control operation of the array of memory cells, the memory control circuitry configured to issue a self-test command to the array, wherein the memory device reports results of a self-test of pre-programmed data executed responsive to receiving the self-test command, and to issue a self-repair command responsive to the results indicating repair of the pre-programmed data is needed.
A system, comprising:
- a host configured to generate control signals;
- and
- a memory device coupled to the host and configured to operate in response to the host control signals, the host further configured to issue a self-test command to the memory device, wherein the memory device reports results of a self-test of pre-programmed data executed responsive to receiving the self-test command, and to issue a self-repair command responsive to the results indicating repair of the pre-programmed data is needed.
Dependencies are inferred from the claim text.