Apparatus and method for determining an operating condition of a memory cell based on cycle information
AssigneeSTEC, Inc.
InventorAshot MELIK-MARTIROSIAN
Life of this patent
Estimating the term…
Loading patent…
AssigneeSTEC, Inc.
InventorAshot MELIK-MARTIROSIAN
Estimating the term…
A method populates a parameter set for dynamically adjusting an operating condition in a memory block of a non-volatile memory circuit. A desired condition limit is identified, and a first parameter is computed as a function of a first memory operation to be performed on the memory block. The first parameter is included in a parameter set, and the memory block is cycled until the operating condition reaches the desired condition limit. After cycling, a second parameter is determined as a function of a second memory operation to be performed on the memory block, and the second parameter is included in the parameter set. The steps of cycling, and determining and the including the second parameter may be repeated until a desired number of cycles/parameters are reached. A retention bake may also be performed on the memory circuit, and a bit error rate resulting from a read operation verified.
A method for populating a parameter set for dynamically adjusting an operating condition in a memory block of a non-volatile memory circuit, comprising:
A method for populating a parameter set for flash memory operations, comprising:
A method for populating a parameter set for flash memory operations, comprising:
Dependencies are inferred from the claim text.