Memory subsystem i/o performance based on in-system empirical testing

An apparatus comprising:

• a host hardware platform including a processor;
• a memory subsystem on the host hardware platform including a memory device;
• a test system embedded in the memory subsystem to perform a search for parameter settings, including for each of multiple different settings for multiple different I/O (input/output) circuit parameters for a target I/O performance characteristic for I/O with the memory device,
• setting a value for each I/O circuit parameter, generating test traffic with a test engine embedded in the host memory subsystem to stress test the memory device, and measuring an operating margin for the I/O performance characteristic, and
• the test system further executing a search function to determine values for each I/O circuit parameter at which the operating margin meets a minimum threshold, and performance of at least one of the I/O circuit parameters is increased, and setting runtime values for the I/O circuit parameters based on the search function.

An electronic device comprising:

• a host hardware platform including a processor;
• a memory subsystem on the host hardware platform including
• a memory device;
• and
• a test system embedded in the memory subsystem to perform a search for parameter settings, including for each of multiple different settings for multiple different I/O (input/output) circuit parameters for a target I/O performance characteristic for I/O with the memory device,
• setting a value for each I/O circuit parameter, generating test traffic with a test engine embedded in the host memory subsystem to stress test the memory device, and measuring an operating margin for the I/O performance characteristic, and
• the test system further executing a search function to determine values for each I/O circuit parameter at which the operating margin meets a minimum threshold, and performance of at least one of the I/O circuit parameters is increased, and setting runtime values for the I/O circuit parameters based on the search function;
• and
• a touchscreen display coupled to generate a display based on data stored in the memory subsystem.