Embedding resin composition for electron microscope, and method for observing sample on electron microscope using said composition

Abstract

The present invention provides an embedding resin composition for electron microscopy having satisfactory performance as an embedding medium, including embedding performance and sectioning quality, and exhibiting excellent antistatic performance; and a method for observing a sample with an electron microscope using the composition. The embedding resin composition for electron microscopy of the present invention having antistatic performance comprises an ionic liquid and an embedding medium comprising an epoxy-based resin, a methacrylate resin or an unsaturated polyester resin. Preferably, the ionic liquid comprising a quaternary ammonium compound based on the formula (I): and an anion selected from the group consisting of BF4−, PF6−, (CF3SO2)2N−, a halide ion, a conjugate base of carboxylic acid, a conjugate base of sulfonic acid and a conjugate base of an inorganic acid.

Dependencies are inferred from the claim text.