Systems and methods for testing and assembling memory modules

A system for testing and assembling memory modules, the system comprising:

• a tester, wherein the tester comprises a processor;
• wherein the processor is configured to, for each memory device of a plurality of memory devices, based on testing performed on the memory device, determine whether the memory device has any defective memory locations;
• wherein the processor is further configured to, if the memory device has one or more defective memory locations, identify the one or more defective memory locations, and generate data that identifies the one or more defective memory locations on the memory device;
• wherein the system is configured to select, from the plurality of memory devices, at least one memory device having one or more defective memory locations, for assembly into a memory module, based on where the defective memory locations are located on each of the at least one memory device;
• wherein the system is further configured to, in response to selecting the at least one memory device having one or more defective memory locations, assemble the memory module using at least the selected at least one memory device having one or more defective memory locations;
• wherein the system is further configured to store, for each memory device having one or more defective memory locations, the data that identifies the one or more defective memory locations on the memory device in a persistent store on the memory module;
• wherein the memory module comprises a microprocessor and persistent memory associated with the microprocessor;
• and
• wherein the persistent store on the memory module comprises the persistent memory associated with the microprocessor.