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US 2014/0211569 A1Published application
Adjusting operational parameters for memory cells
AssigneeMicron Technology, Inc.
InventorSeong Je Park
Life of this patent
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Abstract
Techniques and devices relating to adjusting one or more operational parameters for memory cells are provided. One such device may include a detection unit configured to perform one or more reading operations on a set of memory cells to determine an upper bound of the threshold voltages of the set of memory cells. The device may further include a parameter adjustment unit configured to adjust one or more operational parameters for the set of memory cells based, at least in part, on the determined upper bound of the threshold voltages. Other techniques and devices are also provided.
Claims1
A device, comprising:
- a detection unit to determine an upper bound of threshold voltages for one or more memory cells;
- and
- a parameter adjustment unit to adjust an incremental step pulse programming (ISPP) pulse for the one or more memory cells by changing a duration of a program voltage pulse of the ISPP pulse for the one or more memory cells based, at least in part, on the determined upper bound of the threshold voltages.
Dependencies are inferred from the claim text.