Semiconductor memory device
AssigneeKabushiki Kaisha Toshiba
InventorsHiroshi KANNO, Yoichi MINEMURA, Takayuki TSUKAMOTO
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Abstract
A control circuit is configured to perform, when a plurality of variable resistance elements connected to a selected first wiring line are selected, a read operation to sense a voltage of the selected first wiring line. The control circuit is configured to adjust, according to the voltage of the selected first wiring line sensed in the read operation, a voltage to be applied to the selected first wiring line in a reset operation or a set operation. The reset operation is an operation to increase resistance of a variable resistance element. The set operation is an operation to decrease resistance of a variable resistance element.
Claims16
A semiconductor memory device comprising:
- a memory cell array comprising a plurality of memory cells disposed at intersections of a plurality of first wiring lines and a plurality of second wiring lines, each memory cell comprising a variable resistance element;
- and
- a control circuit configured to perform, when a plurality of variable resistance elements connected to a selected first wiring line are selected, a read operation to sense a voltage of the selected first wiring line, the control circuit also being configured to adjust, according to the voltage of the selected first wiring line sensed in the read operation, a voltage to be applied to the selected first wiring line in a reset operation or a set operation,
- the reset operation being an operation to increase resistance of the variable resistance element, and
- the set operation being an operation to decrease resistance of the variable resistance element.
Dependencies are inferred from the claim text.