Microlithographic projection exposure apparatus
AssigneeCarl Zeiss SMT GmbH
InventorsMichael Layh, Markus Deguenther, Michael Patra, Johannes Wangler, Manfred Maul, Damian Fiolka, Gundula Weiss
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AssigneeCarl Zeiss SMT GmbH
InventorsMichael Layh, Markus Deguenther, Michael Patra, Johannes Wangler, Manfred Maul, Damian Fiolka, Gundula Weiss
Estimating the term…
A projection exposure apparatus for microlithography comprises illumination optics for illuminating object field points of an object field in an object plane is disclosed. The illumination optics have, for each object field point of the object field, an exit pupil associated with the object point, where sin(γ) is a greatest marginal angle value of the exit pupil. The illumination optics include a multi-mirror array that includes a plurality of mirrors to adjust an intensity distribution in exit pupils associated to the object field points. The illumination optics further contain at least one optical system to temporally stabilize the illumination of the multi-mirror array so that, for each object field point, the intensity distribution in the associated exit pupil deviates from a second adjusted intensity distribution in the associated exit pupil by less than 0.1 in at least one of an inner σ or an outer σ.
-58. (canceled)
An apparatus, comprising:
An apparatus, comprising:
Dependencies are inferred from the claim text.