System and method for automatic quality control for assembly line processes

A method for an inspection procedure, the method comprising the steps of:

• (a) providing a device having a plurality of features;
• (b) obtaining a first image of the device;
• (c) processing the first image using a predetermined background filter, wherein the background filter is selected from the group consisting of:
• a binary filter, a gray scale filter, an image enhancement filter, and combinations thereof;
• (d) performing a normalizing procedure of the first image, wherein the normalizing procedure is selected from the group consisting of:
• image resolution processing, scale processing, device rotation processing, and device tilt angle processing;
• (e) providing a second image wherein the second image is a benchmark image for the device;
• (f) characterizing each of the plurality of features in the first image using a first predetermined criteria;
• (g) characterizing each of a plurality of features in the second image using the first predetermined criteria;
• (h) comparing the characterization of one of the plurality of features in the first image with the characterization of the corresponding feature in the second image;
• (i) creating an output image comprising the first image with a highlighted area wherein the highlighted area comprises a defect determined from the comparison;
• (j) repeating step (h) for each of the plurality of features;
• (k) repeating steps (f) through (h) and step (j) using a second predetermined criteria;
• (l) classifying each defect by a type of defect according to a predetermined classification system;
• (m) creating a report including a number of defects by type of defect;
• (n) correlating a first data in the report with a second data from a second inspection method;
• and
• (o) updating a knowledge database with at least one of a result of the comparison of characterization of the one feature and a result of the correlation.

A system for inspecting a device having a plurality of features, the system comprising:

• a C-mode scanning acoustic microscope (“C-SAM”) to obtain a first image of said device;
• a processor operably connected to said C-SAM wherein said processor is programmed to:
• characterize each of the plurality of features in said first image using a first predetermined criteria;
• characterize each of a plurality of features in a second image of said device using the first predetermined criteria, wherein said second image is a benchmark image for said device;
• compare the characterization of one of the plurality of features in said first image with the characterization of the corresponding feature in said second image to thereby identify a defect;
• classify said defect by a type of defect according to a predetermined classification system;
• and
• create a report including a number of defects by type of defect;
• a database operably connected to said processor wherein said database stores said benchmark image and an updated version of the benchmark image;
• and
• imaging circuitry operably connected to said processor for creating an output image comprising the first image with a highlighted area wherein the highlighted area comprises the defect.