Determining A Malfunctioning Device in A Plasma System
AssigneeLam Research Corporation
InventorsJohn C. Valcore, JR., Bradford J. Lyndaker, Arthur Sato
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AssigneeLam Research Corporation
InventorsJohn C. Valcore, JR., Bradford J. Lyndaker, Arthur Sato
Estimating the term…
Systems and methods for determining a malfunctioning device in a plasma system, are described. One of the methods includes receiving an indication whether plasma is generated within a plasma chamber of the plasma system. The plasma system includes a processing portion and a power delivery portion. The method further includes determining whether the plasma system operates within constraints in response to receiving the indication that the plasma is generated, determining a value of a variable at an output of the power delivery portion when the processing portion is decoupled from the power delivery portion, and comparing the determined value with a pre-recorded value of the variable. The method includes determining whether the determined value is outside a range of the pre-recorded value and determining that the malfunctioning device within the power delivery portion upon determining that the determined value is outside the range of the pre-recorded value.
A system for determining a malfunctioning device, the system comprising:
A method for determining a malfunctioning device in a plasma system, comprising:
A method for determining a malfunctioning device in a plasma system, comprising:
Dependencies are inferred from the claim text.