Method for determining a circuit element parameter
AssigneeSemiconductor Components Industries, LLC
InventorsRiley D. Beck, Kent D. Layton, Matthew A. Tyler, Scott R. Grange
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AssigneeSemiconductor Components Industries, LLC
InventorsRiley D. Beck, Kent D. Layton, Matthew A. Tyler, Scott R. Grange
Estimating the term…
A method for determining a circuit element parameter in a ground fault circuit interrupter circuit. An electrical signal provided to a first node is used to generate another electrical signal at a second node. The electrical signal at the second node is multiplexed with a modulation signal to generate a modulated signal that is then filtered and converted into a digital representation of a portion of the circuit element parameter. The electrical signal at the second node is multiplexed with the modulation signal after it has been phase shifted to produce a modulated signal that is filter and converted into a digital representation of another portion of the circuit element parameter. In another aspect, a slope based solenoid self-test method is used for self-testing in a GFCI circuit. Alternatively, a method for determining a wiring fault is provided using a digital filter.
A method for determining a circuit element parameter, comprising:
A method for determining a fault in a transformer, comprising:
A method for determining a fault in a transformer, comprising:
Dependencies are inferred from the claim text.