Apparatuses for and methods of generating images
AssigneeSamsung Electronics Co., Ltd.
InventorsChae-hun LEE, Young KIM, Jae-chul PARK, Yong-woo JEON
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Abstract
An apparatus for generating an image may include a plurality of scintillator layers configured to convert an incident beam into an optical signal; a plurality of micro cells configured to turn on or off depending on whether or not the micro cells detect the optical signal; a reaction depth determining unit configured to detect a decay pattern of the optical signal, on the basis of on/off signals of the micro cells, and configured to determine a type of the scintillator layers with which the incident beam has reacted; and/or a reading unit configured to decide an occurrence location of the incident beam and then generates a photographed image.
Claims16
An apparatus for generating an image, comprising:
- a plurality of scintillator layers configured to convert an incident beam into an optical signal;
- a plurality of micro cells configured to turn on or off depending on whether or not the micro cells detect the optical signal;
- a reaction depth determining unit configured to detect a decay pattern of the optical signal, on the basis of on/off signals of the micro cells, and configured to determine a type of the scintillator layers with which the incident beam has reacted;
- and
- a reading unit configured to decide an occurrence location of the incident beam and then generates a photographed image.
A method of generating an image of an object by using a plurality of scintillator layers and a plurality of micro cells that detect an optical signal generated and output from the scintillator layers, wherein the micro cells are turned on or turned off, depending on whether or not the optical signal generated and output from the scintillator layers is detected, to thus output on/off signals, the method comprising:
- detecting a decay pattern of the optical signal based on the on/off signals of the micro cells;
- determining a type of the scintillator layers with which an incident beam has reacted;
- and
- determining an occurrence location of the incident beam.
Dependencies are inferred from the claim text.