Sample inspection automation system
AssigneeHitachi High-Technologies Corporation
InventorsKenichi Yasuzawa, Koji Kamoshida, Masashi Akutsu
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AssigneeHitachi High-Technologies Corporation
InventorsKenichi Yasuzawa, Koji Kamoshida, Masashi Akutsu
Estimating the term…
There is provided a sample inspection automation system which uses a single holder as its carrier, which can supply empty holders to a distant processing unit on an extended circling path without delay, and which permits continuous operation in case of a failure through detachment of a failed part for example. The system combining a plurality of processing units has an empty holder circling path with a mechanism to circle empty holders across all processing units within the system in unicursal fashion; stoppers for retaining empty holders on the circling path; and a mechanism for controlling the stoppers on the circling path given an empty holder request from a processing unit. The empty holder circling path is made of a plurality of loops each equipped with the stopper. The sample inspection automation system thus configured supplies empty holders efficiently and simplifies system operation through fallback operation.
A sample inspection automation system comprising:
Dependencies are inferred from the claim text.