# US 2014/0197868 A1 · Driving circuit having built-in-self-test function

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- Number: US 2014/0197868 A1
- Document ID: US20140197868A1
- Status: Published application
- Kind: A1
- Application number: 14/157,165
- Filed: 2014-01-16
- Published: 2014-07-17
- Earliest claimed: 2013-01-17
- Assignees: Raydium Semiconductor Corporation
- Applicants: Raydium Semiconductor Corporation
- Inventors: Chih-Chuan Huang; Ko-Yang Tso
- Web page: https://patentgrep.com/patent/US20140197868A1

## CPC

- G09G 3/006: {Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309)}
- G09G 3/36: using liquid crystals
- G09G: ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION (arrangements for transferring data between digital computers and displays G06F3/14; static indicating arrangements comprising an association of a number of separate sources or light control cells G09F9/00; static indicating arrangements comprising integral associations of a number of light sources H01J, H01K, H10H, H05B33/12; scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission, details thereof H04N1/00)

## Abstract

A driving circuit includes at least one reference voltage source, at least one offset unit, and at least one buffer module. The at least one reference voltage source generates a reference voltage. The at least one offset unit generates an offset voltage, wherein the offset voltage and the reference voltage form a judging voltage range. The at least one buffer module has a first input end, a second input end, and an output end, wherein the first input end receives an analog voltage; the at least one reference voltage source is connected with the second input end; the at least one buffer module, according as whether the analog voltage is within the judging voltage range, outputs a pass logic signal or a fail logic signal at the output end. Particularly, the buffer module has Built-In-Self-Test (BIST) function and can increase test efficiency and voltage accuracy.

## Claims

### Claim 1

A driving circuit connected with a display module, comprising:
at least one reference voltage source generating a reference voltage;
at least one offset unit generating an offset voltage, wherein the offset voltage and the reference voltage form a judging voltage range; and
at least one buffer module having a first input end, a second input end, and an output end, wherein the first input end receives an analog voltage, the at least one reference voltage source is connected with the second input end, the at least one buffer module, according as whether the analog voltage is within the judging voltage range, outputs a pass logic signal or a fail logic signal at the output end.

### Claim 2 (depends on 1)

The driving circuit of claim 1, wherein the at least one buffer module comprises:
a digital judgment unit receiving the analog voltage and the judging voltage range and, according as whether the analog voltage is within the judging voltage range, selectively outputting a plurality of digital signals, wherein the digital signals comprise the pass logic signal and the fail logic signal.

### Claim 3 (depends on 1)

The driving circuit of claim 1, wherein the offset unit is disposed in the at least one buffer module to form at least one hysteresis comparator with the at least one buffer module, the offset voltage is a hysteresis offset voltage, and the hysteresis offset voltage is a variable voltage.

### Claim 4 (depends on 1)

The driving circuit of claim 1, wherein a sum of the reference voltage and the offset voltage is an upper limit of the judging voltage range, and a difference between the reference voltage and the offset voltage is a lower limit of the judging voltage range, and the upper limit and the lower limit form the judging voltage range.

### Claim 5 (depends on 1)

The driving circuit of claim 1, wherein the offset unit is disposed in the at least one reference voltage source and has an offset current source, and the offset current source generates the offset voltage.

### Claim 6 (depends on 1)

The driving circuit of claim 1, wherein the offset unit is disposed in the at least one reference voltage source to form an offset source with the at least one reference voltage source, and the offset source outputs the judging voltage range.

### Claim 7 (depends on 1)

The driving circuit of claim 1, wherein the at least one offset unit is disposed in the at least one reference voltage source to form an offset source, and the offset source has a plurality of voltage numbers, the analog voltage corresponds to one voltage number; each voltage number in a sequence corresponds an output voltage value and has a former voltage number and a latter voltage number; the output voltage values which respectively correspond to the former voltage number and the latter voltage number form the judging voltage range.

### Claim 8 (depends on 1)

The driving circuit of claim 1, further comprising:
a switch module connected between the second input end and the output end, wherein the switch module determines whether the reference voltage source is electrically connected with the second input end.

### Claim 9 (depends on 1)

The driving circuit of claim 1, wherein when the analog voltage falls within the judging voltage range, the at least one buffer module outputs the pass logic signal at the output end.

### Claim 10 (depends on 1)

The driving circuit of claim 1, wherein when the analog voltage falls out of the judging voltage range, the at least one buffer module outputs the fail logic signal at the output end.

### Claim 11 (depends on 2)

The driving circuit of claim 2, wherein the at least one buffer module comprises a first buffer module and a second buffer module, and the first buffer module transmits the analog voltage from the output end to the first input end of the second buffer module, so that the second buffer module determines whether the analog voltage outputted from the first buffer module falls within the judging voltage range.

### Claim 12 (depends on 11)

The driving circuit of claim 11, wherein the first buffer module and the second buffer module are disposed in channels having a same polarity, the at least one buffer module has an operating voltage, a partial voltage, and a zero potential voltage, and the at least one buffer module utilizes a difference between the operating voltage and the partial voltage or a difference between the partial voltage and the zero potential voltage to drive the digital judgment unit.

### Claim 13 (depends on 11)

The driving circuit of claim 11, wherein the first buffer module and the second buffer module are disposed in channels having different polarity.

### Claim 14 (depends on 1)

The driving circuit of claim 1, wherein the at least one buffer module has an operating voltage and a zero potential voltage, the pass logic signal is the operating voltage, and the fail logic signal is the zero potential voltage.

### Claim 15 (depends on 1)

The driving circuit of claim 1, wherein the at least one buffer module has an operating voltage and a zero potential voltage, the pass logic signal is the zero potential voltage, and the fail logic signal is the operating voltage.