# US 2014/0197845 A1 · Apparatus for inspecting touch panel and method thereof > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2014/0197845 A1 - Document ID: US20140197845A1 - Status: Published application - Kind: A1 - Application number: 13/961,104 - Filed: 2013-08-07 - Published: 2014-07-17 - Earliest claimed: 2013-01-14 - Assignees: Samsung Display Co., Ltd. - Applicants: Samsung Display Co., Ltd. - Inventors: Jun-Young KO - Web page: https://patentgrep.com/patent/US20140197845A1 ## CPC - G01R 31/2829: {Testing of circuits in sensor or actuator systems (testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844)} - G06F 3/0416: {Control or interface arrangements specially adapted for digitisers} - G06F 3/0446: {using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N) ## Abstract Disclosed herein is an apparatus for inspecting a touch panel and a method thereof, the apparatus includes: a capacitance measuring unit measuring capacitance value of a number of regions set on a touch panel, and a defect determining unit determining whether or not a specific region is defective, by comparing the capacitance value of the specific region with the capacitance value of an adjacent region. According to the present embodiments, a touch panel having an improved defect detection ability and a method thereof, by comparing with capacitance of regions adjacent to each other, are provided. ## Claims ### Claim 1 An apparatus for inspecting a touch panel comprising, a capacitance measuring unit configured to measure a capacitance value of a plurality of regions of a touch panel; and a defect determining unit configured to determine whether or not a specific region is defective by comparing a capacitance value of the specific region with a capacitance value of an adjacent region. ### Claim 2 (depends on 1) The apparatus for inspecting a touch panel according to claim 1, wherein the defect determining unit calculates difference in capacitance values between the specific region and the adjacent region, and then determines that the specific region is defective when the difference in capacitance value is not smaller than a preset reference value. ### Claim 3 (depends on 2) The apparatus for inspecting a touch panel according to claim 2, wherein the defect determining unit divides a plurality of regions of the touch panel into a plurality of groups and applies different reference values to each of groups. ### Claim 4 (depends on 1) The apparatus for inspecting a touch panel according to claim 1, wherein the touch panel includes first sensor electrodes and second sensor electrodes intersected with each other. ### Claim 5 (depends on 4) The apparatus for inspecting a touch panel according to claim 4, wherein the touch panel is operated in a capacitive type manner. ### Claim 6 (depends on 4) The apparatus for inspecting a touch panel according to claim 4, wherein at least one of the first and second sensor electrodes comprise a transparent conductive material. ### Claim 7 (depends on 6) The apparatus for inspecting a touch panel according to claim 6, wherein the transparent conductive material is at least one of indium tin oxide (ITO), indium zinc oxide (IZO), carbon nano tube (CNT), and graphene. ### Claim 8 (depends on 4) The apparatus for inspecting a touch panel according to claim 4, wherein the first sensor electrodes and the second sensor electrodes are positioned on different layers. ### Claim 9 (depends on 4) The apparatus for inspecting a touch panel according to claim 4, wherein the first sensor electrodes and the second sensor electrodes are positioned on the same layer. ### Claim 10 (depends on 9) The apparatus for inspecting a touch panel according to claim 9, wherein the first sensor electrodes and the second sensor electrodes are arranged in a bridge pattern. ### Claim 11 A method of inspecting a touch panel comprising, measuring a capacitance value of a plurality of regions of a touch panel; and comparing the capacitance value in the specific region with the capacitance value in an adjacent region and determining whether or not the region is defective. ### Claim 12 (depends on 11) The method of inspecting a touch panel according to claim 11, wherein in the step of determining, the difference in capacitance value between the specific region and the adjacent region is calculated, and then the specific region is determined to be defective when the difference in capacitance value is not smaller than a preset reference value. ### Claim 13 (depends on 12) The method of inspecting a touch panel according to claim 12, wherein in the step of determining, a plurality of regions of the touch panel is divided into a plurality of groups and different reference values are applied to each of the groups. ### Claim 14 (depends on 11) The method of inspecting a touch panel according to claim 11, wherein the touch panel includes first sensor electrodes and second sensor electrodes intersected with each other. ### Claim 15 (depends on 14) The method of inspecting a touch panel according to claim 14, wherein the touch panel is operated in a capacitive type manner. ### Claim 16 (depends on 14) The method of inspecting a touch panel according to claim 14, wherein at least one of the first and second sensor electrodes comprise a transparent conductive material. ### Claim 17 (depends on 16) The method of inspecting a touch panel according to claim 16, wherein the transparent conductive material is at least one of indium tin oxide (ITO), indium zinc oxide (IZO), carbon nano tube (CNT), and graphene. ### Claim 18 (depends on 14) The method of inspecting a touch panel according to claim 14, wherein the first sensor electrodes and the second sensor electrodes are positioned on different layers. ### Claim 19 (depends on 14) The method of inspecting a touch panel according to claim 14, wherein the first sensor electrodes and the second sensor electrodes are positioned on the same layer. ### Claim 20 (depends on 19) The method of inspecting a touch panel according to claim 19, wherein the first sensor electrodes and the second sensor electrodes are arranged in a bridge pattern.