# US 2014/0197822 A1 · Circuit and measuring system > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2014/0197822 A1 - Document ID: US20140197822A1 - Status: Published application - Kind: A1 - Application number: 14/154,995 - Filed: 2014-01-14 - Published: 2014-07-17 - Earliest claimed: 2013-01-14 - Assignees: Micronas GmbH - Applicants: Micronas GmbH - Inventors: Joachim RITTER; Joerg FRANKE - Web page: https://patentgrep.com/patent/US20140197822A1 ## CPC - G01D 5/16: by varying resistance - G01D 5/145: {influenced by the relative movement between the Hall device and magnetic fields (see G01R33/06)} - G01R 33/072: {Constructional adaptation of the sensor to specific applications} - G01R 33/091: {Constructional adaptation of the sensor to specific applications} - G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract A measuring system having a first magnetic field sensor, a second magnetic field sensor, an encoder, and an evaluation circuit to which the first magnetic field sensor and the second magnetic field sensor are connected. The evaluation circuit generates a first signal and a second measurement signal. The encoder generates a second magnetic field change with a second periodicity. The evaluation circuit generates a second signal with the second periodicity from the first measurement signal of the first magnetic field sensor and the second measurement signal of the second magnetic field sensor according to an absolute value function. ## Claims ### Claim 1 A measuring system comprising: a magnetic field sensor array having a first magnetic field sensor integrated into a semiconductor chip for measuring a first component of a magnetic field in a first spatial direction, and a second magnetic field sensor integrated into a semiconductor chip for measuring a second component of the magnetic field in a second spatial direction; a rotatory encoder that has a plurality of magnets, which with each rotation of the encoder via a plurality of pole pairs, generates a rotation angle-dependent first magnetic field change with a first periodicity in the magnetic field sensor array; and an evaluation circuit connectable to the first magnetic field sensor and the second magnetic field sensor, the evaluation circuit adapted to generate a first signal with the first periodicity from a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor according to an arctangent function, wherein the rotatory encoder is configured to generate a rotation angle-dependent second magnetic field change with a second periodicity in the magnetic field sensor array, a period of the second periodicity corresponding to a rotation of the encoder, wherein the evaluation circuit is configured to generate a second signal with the second periodicity from the first measurement signal of the first magnetic field sensor and the second measurement signal of the second magnetic field sensor according to an absolute value function, and wherein the evaluation circuit has a logic, which is configured to determine a rotation angle of the encoder based on the first signal and the second signal. ### Claim 2 A measuring system comprising: a magnetic field sensor array having a first magnetic field sensor integrated into a semiconductor chip for measuring a first component of a magnetic field in a first spatial direction, and a second magnetic field sensor integrated into a semiconductor chip for measuring a second component of the magnetic field in a second spatial direction; an encoder that is movable along a track and has a plurality of magnets, which with a movement of the encoder along the track via a plurality of pole pairs generate a path-dependent first magnetic field change with a first periodicity in the magnetic field sensor array; and an evaluation circuit connected to the first magnetic field sensor and the second magnetic field sensor, wherein the evaluation circuit is adapted to generate a first signal with the first periodicity from a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor according to an arctangent function, wherein the encoder is adapted to generate a path-dependent second magnetic field change with a second periodicity in the magnetic field sensor array, the second periodicity being greater than the first periodicity, wherein the evaluation circuit is adapted to generate a second signal with the second periodicity from the first measurement signal of the first magnetic field sensor and the second measurement signal of the second magnetic field sensor according to an absolute value function, and wherein the evaluation circuit has a logic that is adapted to determine a position of the encoder based on the first signal and the second signal. ### Claim 3 A measuring system comprising: a magnetic field sensor array having a first magnetic field sensor integrated into a semiconductor chip for measuring a first component of a magnetic field in a first spatial direction, a second magnetic field sensor integrated into a semiconductor chip for measuring a second component of the magnetic field in a second spatial direction, and a magnet; a rotationally movable encoder that has teeth, a material of the teeth influencing a magnetic field of the magnet, the teeth of the encoder adapted to, with each rotation of the encoder, generate a rotation angle-dependent first magnetic field change with a first periodicity in the magnetic field sensor array; and an evaluation circuit connectable to the first magnetic field sensor and the second magnetic field sensor, wherein the evaluation circuit is adapted to generate a first signal with the first periodicity from a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor according to an arctangent function, wherein the encoder generates a rotation angle-dependent second magnetic field change with a second periodicity in the magnetic field sensor array, a period of the second periodicity corresponding to a rotation of the encoder, wherein the evaluation circuit generates a second signal with the second periodicity from the first measurement signal of the first magnetic field sensor and the second measurement signal of the second magnetic field sensor according to an absolute value function, and wherein the evaluation circuit has a logic that determines a rotation angle of the encoder based on the first signal and the second signal. ### Claim 4 A measuring system comprising: a magnetic field sensor array having a first magnetic field sensor integrated into a semiconductor chip for measuring a first component of a magnetic field in a first spatial direction and a second magnetic field sensor integrated into a semiconductor chip for measuring a second component of the magnetic field in a second spatial direction, and a magnet; an encoder movable along a track and having teeth, a material of the teeth influencing a magnetic field of the magnet, the teeth of the encoder, during a movement of the encoder along the track, generate a path-dependent first change of the magnetic field with a first periodicity in the magnetic field sensor array; and an evaluation circuit connected to the first magnetic field sensor and the second magnetic field sensor, wherein the evaluation circuit generates a first signal with the first periodicity from a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor according to an arctangent function, wherein the encoder generates a path-dependent second change of the magnetic field with a second periodicity in the magnetic field sensor array, the second periodicity being greater than the first periodicity, wherein the evaluation circuit generates a second signal with the second periodicity from the first measurement signal of the first magnetic field sensor and the second measurement signal of the second magnetic field sensor according to an absolute value function, and wherein the evaluation circuit has a logic that determines a position of the encoder based on the first signal and the second signal. ### Claim 5 (depends on 2) The measuring system according to claim 2, wherein a period of the second periodicity corresponds to a stretch between the endpoints of the track. ### Claim 6 (depends on 1) The measuring system according to claim 1, wherein the encoder generates the second magnetic field change via a change in an air gap width between the encoder and the magnetic field sensor array. ### Claim 7 (depends on 1) The measuring system according to claim 1, wherein the logic compares a result of the absolute value function with a plurality of threshold values.