# US 2014/0197820 A1 · Measuring system > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2014/0197820 A1 - Document ID: US20140197820A1 - Status: Published application - Kind: A1 - Application number: 14/154,752 - Filed: 2014-01-14 - Published: 2014-07-17 - Earliest claimed: 2013-01-14 - Assignees: Micronas GmbH - Applicants: Micronas GmbH - Inventors: Joachim RITTER; Joerg FRANKE - Web page: https://patentgrep.com/patent/US20140197820A1 ## CPC - G01B 7/14: for measuring distance or clearance between spaced objects or spaced apertures (G01B7/30 takes precedence) - G01D 5/145: {influenced by the relative movement between the Hall device and magnetic fields (see G01R33/06)} - G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS - G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ## Abstract A measuring system having a first magnetic field sensor, an encoder, and an evaluation circuit. The first magnetic field sensor and the second magnetic field sensor and the third magnetic field sensor are connected to the encoder. The evaluation circuit has a logic, which is set up to determine the position of the encoder based on a first measurement signal of a first magnetic field sensor and a second measurement signal of a second magnetic field sensor and a third measurement signal of a third magnetic field sensor. ## Claims ### Claim 1 A measuring system comprising: a magnetic field sensor array that has a first magnetic field sensor integrated into a semiconductor chip for measuring a first component of a magnetic field vector in a first spatial direction, a second magnetic field sensor integrated into a semiconductor chip for measuring a second component of the magnetic field vector in a second spatial direction, and a third magnetic field sensor integrated into a semiconductor chip for measuring a third component of the magnetic field vector in a third spatial direction; an encoder configured to change the magnetic field vector in the first spatial direction and in the second spatial direction and in the third spatial direction as a function of a rotatory and/or translational movement, wherein the change, caused by the movement of the encoder in the magnetic field vector, has a first periodicity in the first spatial direction and in the second spatial direction, wherein the change, caused by the movement of the encoder in the magnetic field vector in the third spatial direction, has a second periodicity, wherein a first period of the first periodicity and a second period of the second periodicity are different; and an evaluation circuit to which the first magnetic field sensor and the second magnetic field sensor and the third magnetic field sensor are connectable, the evaluation circuit being adapted to determine a position of the encoder based on a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor and a third measurement signal of the third magnetic field sensor. ### Claim 2 (depends on 1) The measuring system according to claim 1, wherein the encoder has a plurality of magnets and/or a plurality of coils to generate the magnetic field vector. ### Claim 3 (depends on 1) The measuring system according to claim 1, wherein the magnetic field sensor array has a plurality of magnets and/or a plurality of coils to generate the magnetic field vector. ### Claim 4 (depends on 2) The measuring system according to claim 2, wherein the rotationally movable encoder has a plurality of first magnets and a plurality of second magnets, wherein the plurality of first magnets with each rotation of the encoder via a plurality of pole pairs generates the first magnetic field change with the first periodicity in the magnetic field sensor array in the first spatial direction and the second spatial direction, and wherein the plurality of second magnets with each rotation of the encoder generates the second magnetic field change with the second periodicity in the magnetic field sensor array in the third spatial direction. ### Claim 5 (depends on 2) The measuring system according to claim 2, wherein the encoder is movable along a track relative to the magnetic field sensor array, and has a plurality of first magnets and a plurality of second magnets, wherein the plurality of first magnets with a movement of the encoder along the track via a plurality of pole pairs generates the first magnetic field change with the first periodicity in the magnetic field sensor array in the first spatial direction and in the second spatial direction, and wherein the plurality of second magnets with the movement of the encoder along the track generates the second magnetic field change with the second periodicity in the magnetic field sensor array in the third spatial direction. ### Claim 6 (depends on 3) The measuring system according to claim 3, wherein the rotationally movable encoder has a plurality of teeth, wherein a material of the teeth influences a magnetic field of a magnet of the magnetic field sensor array, wherein the teeth of the encoder are designed with each rotation of the encoder to generate the first magnetic field change of the magnetic field vector in the magnetic field sensor array with the first periodicity in the first spatial direction and second spatial direction, and wherein the encoder is designed with each rotation to generate the second magnetic field change with the second periodicity in the magnetic field sensor array in the third spatial direction. ### Claim 7 (depends on 3) The measuring system according to claim 3, wherein the encoder, movable along a track relative to the magnetic field sensor array, has a plurality of teeth, wherein a material of the teeth influences a magnetic field of a magnet of the magnetic field sensor array, wherein the teeth of the encoder are designed, during movement of the encoder along the track, to generate the first magnetic field change with the first periodicity in the magnetic field sensor array in the first spatial direction and the second spatial direction, and wherein the encoder is designed to generate the second magnetic field change with the second periodicity in the magnetic field sensor array in the third spatial direction along the track. ### Claim 8 (depends on 1) The measuring system according to claim 1, wherein the evaluation circuit is set up to generate the first signal with the first periodicity from the first measurement signal and the second measurement signal according to a first function, particularly an arctangent function. ### Claim 9 (depends on 1) The measuring system according to claim 1, wherein the evaluation circuit is set up to generate a second signal with the second periodicity from the third measurement signal of the third magnetic field sensor according to a second function.