# US 2014/0195851 A1 · Voltage testing device and method for power supply

> Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt

- Number: US 2014/0195851 A1
- Document ID: US20140195851A1
- Status: Published application
- Kind: A1
- Application number: 14/015,714
- Filed: 2013-08-30
- Published: 2014-07-10
- Earliest claimed: 2013-01-05
- Assignees: Hon Hai Precision Industry Co., Ltd.; HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- Applicants: Hon Hai Precision Industry Co., Ltd.; HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.
- Inventors: HAO HU
- Web page: https://patentgrep.com/patent/US20140195851A1

## CPC

- G01R 31/40: Testing power supplies (testing photovoltaic devices H02S50/10)
- G01R 31/2839: {using signal generators, power supplies or circuit analysers (G01R31/2879 takes precedence; multimeters G01R15/12, network analysers G01R27/28)}
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

The disclosure provides a voltage testing device and a method. The voltage testing method includes following steps. The computer sets initial setting parameters for an oscillograph. The computer receives initial testing parameters sent by the oscillograph, and sends a current voltage offset and a current voltage undulating value to the control unit according to the initial testing parameters. The oscillograph obtains voltage values of the power supply during a period of time, produces a voltage wave according to the voltage values, and sends the voltage wave and the voltage values to the computer. The computer displays the voltage wave and the voltage values to the computer.

## Claims

### Claim 1

A voltage testing device comprising:
a computer, the computer comprises a control module, an adjusting module, and a display module; and
an oscillograph, the oscillograph comprises a control unit, an obtaining unit, a storing unit, and a voltage wave producing unit;
wherein the control module is configured to send initial setting parameters to the control unit; the control unit is configured to store the initial setting parameters in the storing unit; the obtaining unit is configured to obtain initial testing parameters when the oscillograph is connected to a power supply; the control unit is further configured to send the initial testing parameters to the adjusting module; the adjusting module is configured to send a current voltage offset and a current voltage undulating value to the control unit according to the initial testing parameters; the obtaining unit is further configured to obtain voltage values of the power supply during a period time after the storing unit stores the current voltage offset and the current voltage undulating value, and to send the voltage values to the voltage wave producing unit; the voltage wave producing unit is configured to produce a voltage wave according to the voltage values, and to send the voltage wave and the voltage values to the control module; and the control module is further configured to display the voltage values and the voltage wave on the display module.

### Claim 2 (depends on 1)

The voltage testing device of claim 1, wherein the computer further comprises a storing module, and the storing module is configured to store the current voltage offset and the current voltage undulating value.

### Claim 3 (depends on 1)

The voltage testing device of claim 1, wherein the initial setting parameters comprises initial voltage offset and initial voltage undulating value.

### Claim 4 (depends on 3)

The voltage testing device of claim 3, wherein the initial setting parameters further comprises time reference, a signal name, a triggering reference, and testing items.

### Claim 5 (depends on 1)

The voltage testing device of claim 1, wherein the initial testing parameters comprise a voltage maximize value and a minimal value during another period of time.

### Claim 6

A voltage testing method, applied in a voltage testing device, comprising:
a computer setting initial setting parameters for an oscillograph;
the computer receiving initial testing parameters sent by the oscillograph, and sending a current voltage offset and a current voltage undulating value to the oscillograph according to the initial testing parameters;
the oscillograph obtaining voltage values of a power supply during a period of time, producing a voltage wave according to the voltage values, and sending the voltage wave and the voltage values to the computer; and
displaying, by the computer, the voltage wave and the voltage values to the computer.

### Claim 7 (depends on 6)

The voltage testing method of claim 6, wherein the current voltage offset and the current voltage undulating value is stored in the computer.

### Claim 8 (depends on 6)

The voltage testing method of claim 6, wherein the initial setting parameters comprises initial voltage offset and initial voltage undulating value.

### Claim 9 (depends on 8)

The voltage testing method of claim 8, wherein the initial setting parameters further comprises time reference, a signal name, a triggering reference, and testing items.

### Claim 10 (depends on 6)

The voltage testing method of claim 6, wherein the initial testing parameters comprise a voltage maximize value and a minimal value during another period of time.