# US 2014/0195191 A1 · Voltage testing device and method for memory > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2014/0195191 A1 - Document ID: US20140195191A1 - Status: Published application - Kind: A1 - Application number: 14/056,249 - Filed: 2013-10-17 - Published: 2014-07-10 - Earliest claimed: 2013-01-05 - Assignees: Hon Hai Precision Industry Co., Ltd.; HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD. - Applicants: Hon Hai Precision Industry Co., Ltd.; HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD. - Inventors: HAO HU - Web page: https://patentgrep.com/patent/US20140195191A1 ## CPC - G11C 29/50012: {of timing} - G11C 11/40: using transistors - G11C: STATIC STORES (semiconductor memory devices H10B) ## Abstract The disclosure provides a voltage testing device and a method. The voltage testing method includes following steps. The computer sets initial setting parameters for an oscillograph and a signal producer. The signal producer sends an initial pulse signal to an input terminal of a memory. The computer receives initial testing parameters of an output terminal of the memory and the initial voltage value of the input terminal sent by the oscillograph, and sends a current voltage offset and a current voltage undulating value to the control unit. The computer sends a current voltage value to the signal producer. The signal producer sends a current pulse signal to the input terminal. The oscillograph obtaining voltage values of the input and output terminals, produces two voltage waves, and sends the two voltage waves and the voltage values to the computer. The computer displays the two voltage waves and the voltage values. ## Claims ### Claim 1 A voltage testing device comprising: a signal producer, the signal producer comprises a sub-control unit and a signal producing unit; an oscillograph, the oscillograph comprises a control unit, an obtaining unit, a storing unit, and a voltage wave producing unit; and the oscillograph is configured to an input terminal and an output terminal of a memory; a computer, the computer comprises a control module, an adjusting module, and a display module; the control module is configured to send first initial setting parameters to the control unit and send second initial setting parameters to the sub-control unit; wherein the control unit is configured to store the first initial setting parameters in the storing unit; the obtaining unit is configured to obtain an initial voltage value of the input terminal and initial testing parameters of the output terminal when the signal producer sends an initial pulse signal to the input terminal; the control unit is further configured to send the initial testing parameters and the initial voltage value to the adjusting module; the adjusting module is configured to send a current voltage offset and a current voltage undulating value to the control unit, according to the initial testing parameters, and to send a current voltage value to the sub-control unit, according to the initial voltage value; the obtaining unit is further configured to obtain voltage values of the input terminal and the output terminal during a period time after the storing unit stores the current voltage offset and the current voltage undulating value and the signal producing unit sends a current pulse signal to the input terminal according to the current voltage value; the voltage wave producing unit is configured to produce two voltage waves corresponding to the input terminal and the output terminal, according to the voltage values, and to send the two voltage waves and the voltage values to the control module; and the control module is further configured to display the voltage values and the two voltage waves on the display module. ### Claim 2 (depends on 1) The voltage testing device of claim 1, wherein the computer further comprises a storing module, and the storing module is configured to store the current voltage offset, the current voltage undulating value, and the current voltage value. ### Claim 3 (depends on 1) The voltage testing device of claim 1, wherein the first initial setting parameters comprises initial voltage offset and initial voltage undulating value. ### Claim 4 (depends on 1) The voltage testing device of claim 1, wherein the second initial setting parameters comprises pulse frequency, high level voltage, and low level voltage. ### Claim 5 (depends on 1) The voltage testing device of claim 1, wherein the initial testing parameters comprise a voltage maximize value and a minimal value during another period of time. ### Claim 6 A voltage testing method, applied in a voltage testing device, comprising: setting initial setting parameters for an oscillograph and a signal producer by a computer; sending an initial pulse signal by the signal producer to an input terminal of a memory; receiving initial testing parameters of an output terminal of the memory and the initial voltage value of the input terminal sent by the oscillograph by the computer; sending a current voltage offset and a current voltage undulating value by the computer to the oscillograph according to the initial testing parameters; and sending a current voltage value by the computer to the signal producer according the initial voltage value; sending a current pulse signal by the signal producer to the input terminal according to the current voltage value; obtaining voltage values of the input terminal and the output terminal during a period of time by the oscillograph, producing two voltage waves corresponding to the input terminal and the output terminal according to the voltage values by the oscillograph, and sending the two voltage waves and the voltage values to the computer by the oscillograph; and displaying, by the computer, the two voltage waves and the voltage values. ### Claim 7 (depends on 6) The voltage testing method of claim 6, wherein the current voltage offset, the current voltage undulating value, and the current voltage value are stored in the computer. ### Claim 8 (depends on 6) The voltage testing method of claim 6, wherein the initial setting parameters comprises initial voltage offset and initial voltage undulating value. ### Claim 9 (depends on 6) The voltage testing method of claim 6, wherein the initial setting parameters of the signal producer comprises pulse frequency, high level voltage, and low level voltage. ### Claim 10 (depends on 6) The voltage testing method of claim 6, wherein the initial testing parameters comprise a voltage maximize value and a minimal value during another period of time.