# US 2014/0192599 A1 · Test partitioning for a non-volatile memory

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- Number: US 2014/0192599 A1
- Document ID: US20140192599A1
- Status: Published application
- Kind: A1
- Application number: 14/204,162
- Filed: 2014-03-11
- Published: 2014-07-10
- Earliest claimed: 2009-07-13
- Assignees: Apple Inc.
- Applicants: Apple Inc.
- Inventors: Matthew J. Byom; Nir J. Wakrat; Kenneth L. Herman
- Web page: https://patentgrep.com/patent/US20140192599A1

## CPC

- G11C 16/06: Auxiliary circuits, e.g. for writing into memory
- G11C 29/08: Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C 29/12: Built-in arrangements for testing, e.g. built-in self testing [BIST] {or interconnection details}
- G11C 16/04: using variable threshold transistors, e.g. FAMOS
- G11C 2029/1206: {Location of test circuitry on chip or wafer}
- G11C: STATIC STORES (semiconductor memory devices H10B)

## Abstract

Systems and methods are provided for testing a non-volatile memory, such as a flash memory. The non-volatile memory may be virtually partitioned into a test region and a general purpose region. A test application may be stored in the general purpose region, and the test application can be executed to run a test of the memory locations in the test region. The results of the test may be stored in the general purpose region. At the completion of the test, the test results may be provided from the general purpose region and displayed to a user. The virtual partitions may be removed prior to shipping the electronic device for distribution.

## Claims

### Claim at position 1

-24. (canceled)

### Claim 25

A method of testing non-volatile memory, comprising:
erasing a portion of a non-volatile memory;
programming a test pattern to a sub-portion of the erased portion;
performing a read operation on the sub-portion; and
determining whether the read operation produces the test pattern.

### Claim 26 (depends on 25)

The method of claim 25, further comprising evaluating results of whether the read operation produces the test pattern.

### Claim 27 (depends on 26)

The method of claim 26, further comprising storing results of the test in the non-volatile memory.

### Claim 28 (depends on 25)

The method of claim 25, further comprising:
virtually partitioning the non-volatile memory into first and second regions;
storing a test application in the first region of the non-volatile memory; and
executing the test application to run a test in the second region of the non-volatile memory.

### Claim 29 (depends on 28)

The method of claim 28, wherein the virtually partitioning comprises:
giving control of physical addresses corresponding to the first region to a first software module; and
giving control of physical addresses corresponding to the second region to a second software module.

### Claim 30

A method of preparing an electronic device for shipment, the electronic device comprising a non-volatile memory, the method comprising:
creating first and second virtual partitions of the non-volatile memory;
testing the second virtual partition, the testing further comprising:
erasing a portion of a non-volatile memory;
programming a test pattern to a sub-portion of the erased portion;
performing a read operation on the sub-portion; and
determining whether the read operation produces the test pattern;
storing results of the testing in the first virtual partition; and
removing the virtual partitions before shipment of the electronic device.

### Claim 31 (depends on 30)

The method of claim 30, further comprising determining whether the results of the testing meet a predetermined specification, wherein the removing is performed responsive to the determining.

### Claim 32 (depends on 30)

The method of claim 30, wherein the creating comprises performing at least one of a firmware update of the electronic device and a software update of the electronic device.

### Claim 33 (depends on 30)

The method of claim 30, wherein the testing comprises identifying memory locations in the second virtual partition that contain defects.

### Claim 34 (depends on 30)

The method of claim 30, wherein the testing comprises executing a test application stored in the first virtual partition.

### Claim 35 (depends on 30)

The method of claim 30, further comprising loading the non-volatile memory with a shipping application after the removing.

### Claim 36

An electronic device comprising:
a non-volatile memory; and
control circuitry operative to:
erase a portion of a non-volatile memory;
program a test pattern to a sub-portion of the erased portion;
perform a read operation on the sub-portion; and
determine whether the read operation produces the test pattern.

### Claim 37 (depends on 36)

The electronic device of claim 36, wherein the non-volatile memory comprises a flash memory.

### Claim 38 (depends on 36)

The electronic device of claim 36, wherein the control circuitry is operative to:
process a test result based on whether the read operation produced the test pattern.

### Claim 39 (depends on 37)

The electronic device of claim 37, wherein the control circuitry is operative to:
store the test results in the non-volatile memory.