# US 2014/0192027 A1 · Tail Effect Correction for SLIM Pattern Touch Panels

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- Number: US 2014/0192027 A1
- Document ID: US20140192027A1
- Status: Published application
- Kind: A1
- Application number: 14/038,423
- Filed: 2013-09-26
- Published: 2014-07-10
- Earliest claimed: 2011-02-24
- Assignees: Cypress Semiconductor Corporation
- Applicants: Cypress Semiconductor Corporation
- Inventors: Petro Ksondzyk; Vasyl Mandziy; Igor Kolych; Massoud Badaye
- Web page: https://patentgrep.com/patent/US20140192027A1

## CPC

- G06F 3/0418: {for error correction or compensation, e.g. based on parallax, calibration or alignment}
- G01N 27/22: by investigating capacitance
- G01R 35/005: {Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references (G01R33/0035, G01R35/002 take precedence)}
- G06F 3/0443: {using a single layer of sensing electrodes}
- G06F 3/0446: {using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes}
- G06F 3/0448: {Details of the electrode shape, e.g. for enhancing the detection of touches, for generating specific electric field shapes, for enhancing display quality}
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

Techniques for correcting tail effect are described herein. In an example embodiment, a device comprises a sensor coupled with a processing logic. The sensor is configured to measure a plurality of measurements from a sensor array, where the measurements are representative of a conductive object that is in contact with or proximate to the sensor array. The sensor array comprises RX electrodes and TX electrodes that are interleaved without intersecting each other in a single layer on a substrate of the sensor array. The processing logic is configured to determine a set of adjustment values that correspond to a tail effect associated with the measurements, and to generate adjusted measurements based on the set of adjustment values, where the adjusted measurements correct a parasitic signal change of the tail effect.

## Claims

### Claim 1

A device comprising:
a sensor array comprising a plurality of receive (RX) electrodes and a plurality of transmit (TX) electrodes, wherein the plurality of RX electrodes and the plurality of TX electrodes are interleaved without intersecting each other within a touch-sensing area in a single layer on a substrate of the sensor array;
a sensor configured to measure a plurality of measurements from the sensor array, wherein the plurality of measurements are representative of a conductive object that is in contact with or proximate to the sensor array; and
a processing logic coupled with the sensor, wherein the processing logic is configured at least to:
determine a set of adjustment values that correspond to a tail effect associated with the conductive object represented by the plurality of measurements; and
generate adjusted measurements corresponding to the conductive object represented by the plurality of measurements based on the set of adjustment values, wherein the adjusted measurements correct the tail effect.

### Claim 2 (depends on 1)

The device of claim 1, wherein the tail effect comprises a parasitic signal increase or a parasitic signal decrease that is caused by parasitic coupling between a primary trace of a RX electrode and a TX electrode that are affected by the conductive object, wherein the primary trace of the RX electrode is routed adjacent to the TX electrode.

### Claim 3 (depends on 2)

The device of claim 2, wherein the primary trace of the RX electrode and a shaped portion of the RX electrode are disposed in the touch-sensing area of the sensor array, but the shaped portion of the RX electrode is not affected by the conductive object.

### Claim 4 (depends on 1)

The device of claim 1, wherein the sensor array comprises a first non-sensing area and a second non-sensing area on opposite sides of the sensor array, with a first subset of the plurality of RX electrodes and a first subset of the plurality of TX electrodes being routed from the first non-sensing area, and a second subset of the plurality of RX electrodes and a second subset of the plurality of TX electrodes being routed from the second non-sensing area.

### Claim 5 (depends on 1)

The device of claim 1, wherein the processing logic is further configured to determine location coordinates on the sensor array for the conductive object based on the adjusted measurements.

### Claim 6 (depends on 1)

The device of claim 1, wherein the plurality of measurements include signal values for sensor elements formed by a particular TX electrode of the sensor array, and wherein the adjusted measurements include adjusted values corresponding to the signal values.

### Claim 7 (depends on 6)

The device of claim 6, wherein in order to determine the adjusted values for the particular TX electrode, the processing logic is configured to:
compute a sum of indices of RX electrodes that form the sensor elements along the particular TX electrode;
compute a sum of the signal values for the sensor elements along the particular TX electrode;
compute a parameter value based on the sum of indices and the sum of the signal values; and
adjust each signal value of the signal values, to obtain a corresponding adjusted value, based at least on: said each signal value, the parameter value, and an index of a corresponding RX electrode.

### Claim 8 (depends on 6)

The device of claim 6, wherein the signal values, for the sensor elements formed by the particular TX electrode, are less than a tail-effect threshold value.

### Claim 9 (depends on 6)

The device of claim 6, wherein the RX electrodes, which form the sensor elements along the particular TX electrode, have indices that are greater than an index of a RX electrode that forms a sensor element having a peak signal value.

### Claim 10

A method comprising:
receiving a plurality of measurements that are measured from a sensor array, wherein the plurality of measurements are representative of a conductive object that is in contact with or proximate to the sensor array;
wherein the sensor array comprises a plurality of receive (RX) electrodes and a plurality of transmit (TX) electrodes, wherein the plurality of RX electrodes and the plurality of TX electrodes are interleaved without intersecting each other within a touch-sensing area in a single layer on a substrate of the sensor array;
a processing device determining a set of adjustment values that correspond to a tail effect associated with the conductive object represented by the plurality of measurements; and
generating adjusted measurements corresponding to the conductive object represented by the plurality of measurements based on the set of adjustment values, wherein the adjusted measurements correct the tail effect.

### Claim 11 (depends on 10)

The method of claim 10, wherein the tail effect comprises a parasitic signal increase or a parasitic signal decrease that is caused by parasitic coupling between a primary trace of a RX electrode and a TX electrode that are affected by the conductive object, and wherein the primary trace of the RX electrode is routed adjacent to the TX electrode.

### Claim 12 (depends on 11)

The method of claim 11, wherein the primary trace of the RX electrode and a shaped portion of the RX electrode are disposed in the touch-sensing area of the sensor array, but the shaped portion of the RX electrode is not affected by the conductive object.

### Claim 13 (depends on 10)

The method of claim 10, further comprising determining diff signals for sensor elements of the sensor array based on the received plurality of measurements.

### Claim 14 (depends on 10)

The method of claim 10, wherein:
the plurality of measurements include signal values for sensor elements formed by a particular TX electrode of the sensor array; and
the processing device determining the adjusted measurements comprises:
computing a sum of indices of RX electrodes that form the sensor elements along the particular TX electrode;
computing a sum of the signal values for the sensor elements along the particular TX electrode;
computing a parameter value based on the sum of indices and the sum of the signal values; and
adjusting each signal value of the signal values, to obtain a corresponding adjusted value, based at least on: said each signal value, the parameter value, and an index of a corresponding RX electrode.

### Claim 15 (depends on 14)

The method of claim 14, wherein the processing device determining the adjusted measurements further comprises:
selecting the signal values, for the sensor elements formed by the particular TX electrode of the sensor array, by comparing the plurality of measurements to a tail-effect threshold value.

### Claim 16 (depends on 14)

The method of claim 14, wherein the processing device determining the adjusted measurements further comprises:
determining a first index of an RX electrode that forms a sensor element having a peak signal value; and
selecting the signal values, for the sensor elements formed by the particular TX electrode of the sensor array, by selecting only those signal values that are less than a tail-effect threshold value and that have indices greater than the first index.

### Claim 17 (depends on 10)

The method of claim 10, further comprising determining location coordinates on the sensor array for the conductive object based on the adjusted measurements.

### Claim 18

A system comprising:
a capacitive sensor array comprising a plurality of receive (RX) electrodes and a plurality of transmit (TX) electrodes, wherein the plurality of RX electrodes and the plurality of TX electrodes are interleaved without intersecting each other within a touch-sensing area in a single layer on a substrate of the capacitive sensor array;
a capacitive sensor coupled with the capacitive sensor array, the capacitive sensor configured to measure a plurality of measurements from the plurality of RX electrodes, wherein the plurality of measurements are representative of a conductive object that is in contact with or proximate to the capacitive sensor array; and
a processing logic coupled with the capacitive sensor, wherein the processing logic is configured at least to:
determine a set of adjustment values that correspond to a tail effect associated with the conductive object represented by the plurality of measurements; and
generate adjusted measurements corresponding to the conductive object represented by the plurality of measurements based on the set of adjustment values, wherein the adjusted measurements correct the tail effect.

### Claim 19 (depends on 18)

The system of claim 18, wherein:
the tail effect comprises a parasitic signal increase or a parasitic signal decrease that is caused by parasitic capacitive coupling between a primary trace of a RX electrode and a TX electrode that are affected by the conductive object, wherein the primary trace of the RX electrode is routed adjacent to the TX electrode; and
the primary trace of the RX electrode and a shaped portion of the RX electrode are disposed in the touch-sensing area of the capacitive sensor array, but the shaped portion of the RX electrode is not affected by the conductive object.

### Claim 20 (depends on 18)

The system of claim 18, wherein the capacitive sensor array comprises a first non-sensing area and a second non-sensing area on opposite sides of the capacitive sensor array, with a first subset of the plurality of RX electrodes and a first subset of the plurality of TX electrodes being routed from the first non-sensing area, and a second subset of the plurality of RX electrodes and a second subset of the plurality of TX electrodes being routed from the second non-sensing area.