# US 2014/0191109 A1 · Assay Apparatuses, Methods and Reagants

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- Number: US 2014/0191109 A1
- Document ID: US20140191109A1
- Status: Published application
- Kind: A1
- Application number: 14/147,216
- Filed: 2014-01-03
- Published: 2014-07-10
- Earliest claimed: 2013-01-04
- Assignees: Meso Scale Technologies, LLC.
- Applicants: Meso Scale Technologies, LLC
- Inventors: Ian Chamberlin; Charles M. Clinton; Eli N. Glezer; Bandele Jeffrey-Coker; Manish Kochar; Sandor Kovacs; D.T. Le; Aaron Leimkuehler; George Sigal; Leo Tabakin; Jon Willoughby
- Web page: https://patentgrep.com/patent/US20140191109A1

## CPC

- G02B 7/36: using image sharpness techniques {, e.g. image processing techniques for generating autofocus signals (image data processing per se G06T; in cameras having a solid state image sensor H04N23/67)}
- G01N 21/253: {for batch operation, i.e. multisample apparatus (analytical automats G01N35/00)}
- G01N 21/6452: {Individual samples arranged in a regular 2D-array, e.g. multiwell plates}
- G01N 35/028: {having reaction cells in the form of microtitration plates}
- G02B: OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)

## Abstract

Apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation are described. They are particularly well suited for conducting automated analysis in a multi-well plate assay format.

## Claims

### Claim 1

An instrument comprising:
a contact platform, wherein the contact platform comprises a plurality of interrogation zones and each interrogation zone comprises at least a pair of electrical contacts to conduct a voltage potential to the interrogation zone, and
a controller operatively connected to a voltage source, wherein the voltage source is connectable to one or more pairs of electrical contacts, and
a multiplexer connected to the controller and to the voltage source for selectively connecting the voltage source to the pair of electrical contacts of a single interrogation zone or connecting the voltage source to the pairs of electrical contacts of more than one interrogation zones.

### Claim 2 (depends on 1)

The instrument of claim 1, wherein the plurality of interrogation zones are arranged in a P×Q matrix.

### Claim 3

An instrument adapted to interrogate samples contained in a multi-well plate comprising:
a carriage frame configured to support the multi-well plate and the carriage frame is movable relative to a contact platform,
wherein the multi-well plate comprises a plurality of wells, wherein the wells are arranged in a M×N matrix, and
wherein the contact platform comprises a plurality of interrogation zones, wherein each interrogation zone comprises at least a pair of electrical contacts to conduct a voltage potential to at least one well, and
a controller operatively connected to a motor to move the carriage frame relative to the contact platform and operatively connected to a voltage source, wherein the voltage source is connectable to one or more pairs of electrical contacts, and
a multiplexer connected to the controller and to the voltage source for selectively connecting the voltage source to the pair of electrical contacts of a single interrogation zone or connecting the voltage source to at least one pair of electrical contacts of more than one interrogation zones.

### Claim 4 (depends on 3)

The instrument of claim 3, wherein the interrogation zones are arranged in a P×Q matrix, and wherein the M×N matrix is larger than the P×Q matrix, and

### Claim 5 (depends on 3)

The instrument of claim 3, wherein multi-well plate comprises bottom electrical contacts on a bottom surface of the plate for each well, wherein the bottom electrical contacts are adapted to contact the pairs of electrical contacts on the contact platform.

### Claim 6 (depends on 5)

The instrument of claim 5, wherein the multi-well plate further comprises internal electrical contacts connected to the bottom electrical contacts to conduct the voltage potential to within the wells.

### Claim 7 (depends on 3)

The instrument of claim 3, wherein the electrical contacts on the platform comprises a plurality of working electrodes that are selectively connected by the controller to the voltage source determine the number of wells to interrogate.

### Claim 8 (depends on 7)

The instrument of claim 7, wherein the working terminals that are not connected are electrically isolated in the multiplexer.

### Claim 9 (depends on 7)

The instrument of claim 7, wherein the electrical contacts on the platform further comprises a plurality of counter electrodes that are electrically connected to at least one electrical ground.

### Claim 10 (depends on 9)

The instrument of claim 9, wherein the bottom electrical contacts of the multi-well tray that are connected to the counter electrode on the contact platform for at least one well are electrically isolated.

### Claim 11

A focusing mechanism for an optical sensor comprising at least a higher, middle and lower patterned surface spaced apart from the optical sensor;
wherein the middle patterned surface is aligned to a target surface to be focused by the optical sensor and the middle patterned surface
wherein a first distance between the higher and middle patterned surfaces and a second distance between the middle surface and lower patterned surface are substantially equal,
wherein the optical sensor and the patterned surfaces are moved relative to each other until a difference between a first and a second contrast value difference is less than a predetermined value; and
an illuminating source positioned to project light through the higher, middle and lowered patterned surfaces toward the optical sensor.

### Claim 12 (depends on 11)

The focusing mechanism of claim 11, wherein the target surface comprises a reference surface of a platform that selectively conduct electricity to samples that are interrogated by the optical sensor.

### Claim 13 (depends on 12)

The focusing mechanism of claim 12, wherein the middle patterned surface is aligned to the reference surface of platform by a predetermined amount.

### Claim 14 (depends on 11)

The focusing mechanism of claim 11, wherein the target surface comprises a bottom surface of a tray carrying at least one sample to be interrogated by the optical sensor.

### Claim 15 (depends on 14)

The focusing mechanism of claim 14, wherein middle patterned surface and the bottom surface of the tray are aligned to substantially a same planar level.

### Claim 16

A method for focusing an optical sensor to a spaced apart platform comprising the steps of
a. providing at least a higher, middle and lower patterned surface, wherein the middle patterned surface and the platform are aligned to each other and wherein a first distance between the higher and middle patterned surfaces and a second distance between the middle surface and lower patterned surface are substantially equal;
b. obtaining a first contrast value difference between the higher and middle patterned surfaces with the optical sensor;
c. obtaining a second contrast value difference between the middle and lower patterned surfaces with the optical sensor;
d. comparing the first and second contrast value differences.

### Claim 17 (depends on 16)

The method of claim 16 further comprising the step of (e) adjusting a distance between the optical sensor and the platform and repeat steps (b) to (d) until a difference between the first and second contrast value differences to be less than a predetermined value.

### Claim 18 (depends on 16)

The method of claim 16, wherein the middle patterned surface is aligned substantially to a same planar level as a bottom surface of a tray carrying at least one sample to be interrogated by the optical sensor.

### Claim 19 (depends on 18)

The method of claim 18, wherein the platform comprises a plurality of electrodes that contact the bottom surface of the tray to conduct electricity to the at least one sample.

### Claim 20 (depends on 16)

The method of claim 16, wherein the higher, middle and lower patterned surfaces are located on parallel planar planes.

### Claim 21 (depends on 17)

The method of claim 17, wherein the predetermined value is less than about ±4.0.