Electromigration analysis for standard cell based designs

A method comprising:

• by a processor, performing operations for:
• characterizing a standard cell to create a parameterized thermal model to compute a temperature of an internal structure of the standard cell, and to create a parameterized current model to compute a current through the internal structure of the standard cell given in context electrical parameters, wherein the parameterized thermal model includes external heating effects on the standard cell caused by at least one of a substrate or a neighbor at corresponding temperatures.

A non-transitory computer readable medium storing control logic for execution by a processor, the control logic comprising instructions to:

• generate an estimate of a failure rate of a design that includes a plurality of cell instances of a standard cell using in context electrical parameters for the plurality of cell instances and a parameterized electromigration (EM) view of the standard cell, the estimate including external heating effects on each cell instance of the standard cell caused by at least one of a substrate or a neighbor at corresponding temperatures.