Method and apparatus for enhanced static ir drop analysis
AssigneeQUALCOMM Incorporated
InventorsKhusro Sajid, Mamta Bansal, Karim Arabi
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AssigneeQUALCOMM Incorporated
InventorsKhusro Sajid, Mamta Bansal, Karim Arabi
Estimating the term…
Methods and apparatus for Enhanced Static IR Drop Analysis are provided. Enhanced Static IR Drop Analysis can be used to determine a quality and robustness of a power distribution network in a circuit. In examples, Enhanced Static IR Drop Analysis includes recording time points at which global current demand profile peaks, sampling instantaneous current from individual tile-based current demand profiles at each time point, and running Static IR Analysis for the tiles at the time points to determine tile current use by the tiles during the time points. Enhanced Static IR Drop Analysis can be used for quick assessment of peak current distribution and determining how the peak current distribution stresses the power distribution network. Enhanced Static IR Drop Analysis is useful during earlier stages of circuit design, when quickly producing circuit performance data is imperative and conventional techniques require significant resources.
A method for performing enhanced static IR analysis on a device, comprising:
An apparatus configured to perform enhanced static IR analysis on a device, comprising:
An apparatus configured to perform enhanced static IR analysis on a device, comprising:
A non-transitory computer-readable medium, comprising instructions stored thereon that, if executed by a processor, cause the processor to execute a method comprising:
Dependencies are inferred from the claim text.