Error recovery within integrated circuit
AssigneesThe Regents of the University of Michigan, Arm Limited
InventorsKrisztian FLAUTNER, Todd Michael AUSTIN, David Theodore BLAAUW, Trevor Nigel MUDGE, David BULL
Life of this patent
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Abstract
An integrated circuit includes one or more portions having error detection and error correction circuits and which is operated with operating parameters giving finite non-zero error rate as well as one or more portions formed and operated to provide a zero error rate.
Claims17
An integrated circuit for performing data processing, said integrated circuit comprising:
- an error detector configured to detect errors in operation of said integrated circuit;
- error-repair circuitry configured to repair errors in operation of said integrated circuit;
- wherein
- at least one portion of said integrated circuit is configured to operate with one or more operational parameters controlled to vary an error rate within said at least one portion;
- said one or more operational parameters include a power supply to said at least one portion;
- and
- said power supply to said at least one portion is provided via one or more power gates configured to vary said power supply to said at least one portion.
An integrated circuit for performing data processing, said integrated circuit comprising:
- error detector means for detecting errors in operation of said integrated circuit;
- error-repair means for repairing errors in operation of said integrated circuit;
- wherein
- at least one portion of said integrated circuit is configured to operate with one or more operational parameters controlled to vary an error rate within said at least one portion;
- said one or more operational parameters include a power supply to said at least one portion;
- and
- said power supply to said at least one portion is provided via one or more power gates configured to vary said power supply to said at least one portion.
A method of operating an integrated circuit, said method comprising the steps of:
- detecting errors in operation of said integrated circuit;
- repairing errors in operation of said integrated circuit;
- wherein
- at least one portion of said integrated circuit is configured to operate with one or more operational parameters controlled to vary an error rate within said at least one portion;
- said one or more operational parameters include a power supply to said at least one portion;
- and
- said power supply to said at least one portion is provided via one or more power gates configured to vary said power supply to said at least one portion.
Dependencies are inferred from the claim text.