Methods and systems for analyzing detection enhancement of microcantilevers with long-slit based sensors
AssigneeKambix Innovations, LLC
InventorsKambiz Vafai, Abdul Rahim A. Khaled
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Abstract
Methods and systems for analyzing the detection enhancement of rectangular microcantilevers with long-slit microsensors. The deflection profile of the microcantilevers can he compared with that of typical rectangular microcantilevers under presence of dynamic disturbances. Various force-loading conditions are considered. The theory of linear elasticity for thin beams is used to obtain the deflection related quantities. The disturbance in these quantities can be obtained based on wave propagation and beam vibration theories.
Claims5
A method for analyzing detection enhancement of rectangular microcantilevers with long-slit in microsensing applications, said method comprising:
- comparing a deflection profile associated at least one rectangular microcantilever with long-slit with that of typical rectangular microcantilevers under static conditions;
- comparing a deflection profile associated at least one rectangular microcantilever with long-slit with that of typical rectangular microcantilevers under a presence of dynamic disturbances;
- considering various force-loading conditions with respect to said at least one rectangular microcantilever with long-slit;
- calculating a plurality of deflection related quantities with respect to said at least one rectangular microcantilever with long-slit based on a linear elasticity;
- and
- obtaining a disturbance in said quantities based on wave propagation and beam vibration theories to derive data indicative of detection enhancement with respect to said at least one rectangular microcantilever with long-slit,
Dependencies are inferred from the claim text.