Method and system for automated device testing
AssigneeBroadcom Corporation
InventorsBaruyr MIRICAN, Tyler Tolman, Jeffrey Brueggeman
Life of this patent
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Abstract
Embodiments described herein provide enhanced testing of devices. For example, in an embodiment, an interposer for testing devices is provided. The interposer includes a substrate, a first plurality of connection elements located on a surface of the substrate, and a memory device electrically coupled to the first plurality of connection elements through the substrate. The first plurality of connection elements are configured to mate with a second plurality of connection elements located on a device under test. The memory device is configured to store information received from the device under test and to output stored information to the device under test.
Claims20
An interposer for testing devices, comprising:
- a substrate;
- a first plurality of connection elements located on a surface of the substrate;
- and
- a memory device electrically coupled to the first plurality of connection elements through the substrate;
- wherein the first plurality of connection elements are configured to mate with a second plurality of connection elements located on a device under test and wherein the memory device is configured to store information received from the device under test and to output stored information to the device under test.
A system for testing devices, comprising:
- an actuator having an interposer, the interposer comprising:
- a substrate;
- a first plurality of connection elements located on a surface of the substrate;
- and
- a memory device electrically coupled to the first plurality of connection elements through the substrate;
- wherein the first plurality of connection elements are configured to mate with a second plurality of connection elements located on a device under test;
- and
- a device interface board, comprising:
- a test socket configured to receive the device under test;
- and
- a controller electrically coupled to the test socket, wherein the controller is configured to control the device under test to store information in the memory device and to output stored information received from the memory device.
A method of testing a device, comprising:
- receiving the device at a socket of a device interface board, wherein the device is transported to the socket using an actuator;
- controlling the device to output a value stored in a memory device, wherein the memory device is located in the actuator;
- and
- determining if the device is functional based on the value output by the device.
Dependencies are inferred from the claim text.