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US 2014/0177313 A1Published application
Semiconductor device and method of operation
AssigneeSK hynix Inc.
InventorsJoo Hyeon LEE, Jun Hyun CHUN, Ho Uk SONG
Life of this patent
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Abstract
A semiconductor device and method of operation having reduced read time of fuse array information during boot-up operation. When fuse array information is read, only repaired fuse-set information is read such that a read time of the semiconductor memory device is reduced, resulting in an increased read margin.
Claims16
A semiconductor device comprising:
- a fuse array configured to include a plurality of fuse-sets;
- a counting unit configured to count a column read signal;
- a decoding unit for decoding an output signal of the counting unit, and outputting the decoding result to the fuse array;
- and
- a read controller for controlling a read operation region of the fuse array in response to a read control signal and a second execution signal received from the counting unit.
2 more elements
A method for operating a semiconductor device, the method comprising the steps of:
- providing a fuse array including a plurality of fuse-sets, wherein the fuse-sets include information relating to repaired memory cells and non-repaired memory cells;
- and
- controlling operation of a read controller to determine a read operation region of the fuse array such that only information relating to repaired memory cells is read from the fuse array.
Dependencies are inferred from the claim text.