Method and Configuration for the Optical Detection of an Illuminated Specimen

A method for the optical detection of an illuminated specimen, comprising causing illuminating light to impinge in a spatially structured manner in at least one plane on the specimen, and acquiring several images of the specimen by means of a detector in different positions of the structure on the specimen, from which images an optical sectional image and/or an image with enhanced resolution is calculated, wherein a light distribution is generated in or near the pupil, which light distribution generates the effect of a structured illumination on the specimen.

A method for the optical detection of an illuminated specimen, comprising causing illuminating light to impinge in a spatially structured manner in at least one plane on the specimen, and acquiring several images of the specimen by a detector in different positions of the structure on the specimen, from which images an optical sectional image and/or an image with enhanced resolution is calculated, wherein a diffraction image or a light distribution is generated in a plane conjugate to the plane of the pupil and transmitted via an intermediate image into the plane of a transparent beam divider with several reflecting regions, which beam divider feeds the diffraction image or the light distribution via the reflecting regions into the direction of the specimen beam divider in or near the pupil.

A configuration for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen, and several images of the specimen are acquired by a detector in different positions of the structure on the specimen, from which images an optical sectional image and/or an image with enhanced resolution is calculated, comprising a diffraction pattern generated in the direction of the specimen, in or near the pupil of the objective lens or in a plane conjugate to said pupil, and a structured phase plate with regions of different phase delays dedicated to said diffraction pattern in or near the pupil of the objective lens or in a plane conjugate to said pupil, which phase plate is constructed so as to be pivotable in order to set different phase angles of the illuminating light for at least one diffraction order on the sample.

A configuration for the optical detection of an illuminated specimen, wherein illuminating light impinges in a spatially structured manner in at least one plane on the specimen, and several images of the specimen are acquired by a detector in different positions of the structure on the specimen, from which images an optical sectional image and/or an image with enhanced resolution is/are calculated, comprising means for generating a light distribution disposed in or near the pupil, which light distribution generates the effect of structured illumination on the specimen.

A configuration for the optical detection of an illuminated specimen, wherein the illuminating light impinges in a spatially structured manner in at least one plane on the specimen, and several images of the specimen are acquired by means of a detector in different positions of the structure on the specimen, from which images an optical sectional image and/or an image with enhanced resolution is calculated, in particular as in one of the preceding claims, wherein a diffraction image or a light distribution is generated in a plane conjugate to the plane of the pupil and preferably imaged via an intermediate image in the plane of a transparent beam divider with several reflecting regions, which beam divider feeds the light via the reflecting regions into the direction of the specimen.