Reflection characteristic measuring apparatus

A measuring apparatus for measuring a reflection characteristic of a surface, the measuring apparatus comprising:

• an illumination device including a surface light source and configured to illuminate the surface with light from the surface light source;
• a detector configured to detect a light intensity distribution formed on a light-receiving surface by reflected light from the surface illuminated by said illumination device;
• and
• a processor configured to obtain the reflection characteristic based on first data of the light intensity distribution detected by said detector,
• wherein said processor is configured to estimate, based on the first data, second data of a light intensity distribution formed on the light-receiving surface by specular reflected light from the surface and third data of a light intensity distribution formed on the light-receiving surface by diffuse reflected light from the surface in a case where a point light source is disposed at each position in a light-emitting region of the surface light source, and to estimate, based on the second data and the third data, a light intensity distribution formed on the light-receiving surface by reflected light from the surface in a case where a light source, at least one of a shape and a size of a light-emitting region of which is different from that of the surface light source, is disposed in place of the surface light source.