Measuring Method And System For Measuring Positions Of Elements Of A Structure
AssigneesEADS Deutschland GmbH, Airbus Operations GmbH
InventorsJohannes Maslennikov, Benjamin Becker, Peter Keitler
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Abstract
A method for measuring a position of an element of a structure includes the steps of: attaching a receiving device to the element at a measurement position; attaching a first reference device to the receiving device; determining a first measurement point with a first measurement device adapted to measure a position of the first reference device; removing the first reference device; attaching a second reference device to the receiving device; and determining a second measurement point with a second measurement device adapted to measure a position of the second reference device.
Claims15
A method for measuring a position of an element of a structure, the method comprising:
- attaching a receiving device to the element at a measurement position;
- attaching a first reference device to the receiving device
- determining a first measurement point with a first measurement device adapted to measure a position of the first reference device;
- removing the first reference device;
- attaching a second reference device to the receiving device;
- determining a second measurement point with a second measurement device adapted to measure a position of the second reference device.
A measurement system, comprising:
- a plurality of receiving devices;
- a plurality of first reference devices;
- and
- a plurality of second reference devices;
- wherein each of the plurality of receiving devices comprises a first bearing element for temporarily attaching a second bearing element of one of the first and second reference devices, such that a reference point of a reference device does not move with respect to a receiving device the reference device is attached to, when the reference device is rotated with respect to the receiving device;
- wherein each of the first reference devices carries a first measurement target for a first position measurement device;
- and
- wherein each of the second reference devices carries a second measurement target for a second position measurement device.
Dependencies are inferred from the claim text.