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US 2014/0176212 A1Published application
Scan flip-flop, method of operating the same, and device including the scan flip-flop
AssigneeSamsung Electronics Co., Ltd.
InventorMin Su Kim
Life of this patent
Estimating the term…
Abstract
A scan flip-flop may include a selector outputting a data signal or a scan input signal in response to a scan enable signal, and a flip-flop that latches an output signal of the selector or the data signal, based on a clock signal and a low voltage signal.
Claims20
A scan flip-flop comprising:
- a selector to output a data signal or a scan input signal under control of a scan enable signal;
- and
- a flip-flop to latch an output signal of the selector or the data signal, under control of on a clock signal and a low voltage signal, wherein the low voltage signal is a control signal indicative of whether the scan flip-flop is operating with a low operating voltage.
A method of operating a scan flip-flop, the method comprising:
- outputting a data signal or a scan input signal as a first output signal in response to a scan enable signal;
- and
- latching the first output signal or the data signal, based on a clock signal and a low voltage signal, wherein the low voltage signal is a control signal indicative of whether the scan flip-flop is operating with a low operating voltage.
A scan flip-flop comprising:
- a flip-flop including a data input port and a scan input port;
- and
- a selector connected to the scan input port,
- wherein data signal or scan input signal is input to the scan input port via the selector according to a scan operating mode and a low voltage operating mode, and the data signal is directly input to the data input port according to a normal operating mode.
1 more element
Dependencies are inferred from the claim text.