Probe card capable of transmitting high-frequency signals

A probe card capable of transmitting high-frequency signals provided by a device under test (DUT), wherein the DUT includes an output pin group and an input pin group for sending and receiving the high-frequency signals respectively, the probe card comprising:

• a first signal pin group, which is made of a conductive material, for contacting the output pin group of the DUT;
• a second signal pin group, which is made of a conductive material, for contacting the input pin group of the DUT;
• and
• a multiband circuit, which is electrically connected to the first signal pin group and the second signal pin group to allow signals within a first bandwidth and a second bandwidth to pass therethrough, and signals beyond the first and the second bandwidths are attenuated or filtered out;
• wherein, a lowest frequency of the first bandwidth is 0 Hz, and a highest frequency of the first bandwidth is lower than a lowest frequency of the second band;
• the high-frequency signals for transmission are within the second bandwidth;
• whereby, once the output pin group of the DUT sends the high-frequency signals, the high-frequency signals are transmitted to the multiband circuit through the first signal pin group, and then transmitted to the input pin group of the DUT through the second signal pin group.