# US 2014/0157007 A1 · System and method of adaptive voltage scaling

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- Number: US 2014/0157007 A1
- Document ID: US20140157007A1
- Status: Published application
- Kind: A1
- Application number: 13/692,735
- Filed: 2012-12-03
- Published: 2014-06-05
- Earliest claimed: 2012-12-03
- Assignees: QUALCOMM Incorporated
- Applicants: Qualcomm Incorporated
- Inventors: Madan Krishnappa
- Web page: https://patentgrep.com/patent/US20140157007A1

## CPC

- H02J 4/00: Circuit arrangements for mains or distribution networks not specified as AC or DC; Circuit arrangements for mains or distribution networks combining AC and DC sections or sub-networks (arrangements using intermediate DC-AC-DC conversion H02J1/002; arrangements using high-voltage DC [HVDC] links H02J3/36)
- G06F 1/28: Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
- G06F 1/3296: by lowering the supply or operating voltage
- Y02D 10/00: Energy efficient computing, e.g. low power processors, power management or thermal management
- H02J: ELECTRIC POWER NETWORKS; CIRCUIT ARRANGEMENTS OR SYSTEMS FOR SUPPLYING OR DISTRIBUTING ELECTRIC POWER; SYSTEMS FOR STORING ELECTRIC ENERGY
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)
- Y02D: CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE

## Abstract

A particular method includes, prior to issuing a recommendation by an adaptive voltage scaling (AVS) system, performing a first iteration of an AVS operation to sample characteristics of a semiconductor device to determine a first adjustment recommendation. The method further includes performing at least one additional iteration of the AVS operation to determine at least one additional adjustment iteration. When a threshold number of consecutive adjustment recommendations are consistent, the method includes issuing the recommendation by the AVS system.

## Claims

### Claim 1

A method comprising:
prior to issuing a recommendation by an adaptive voltage scaling (AVS) system:
performing a first iteration of an AVS operation to sample characteristics of a semiconductor device to determine a first adjustment recommendation; and
performing at least one additional iteration of the AVS operation to determine at least one additional adjustment recommendation; and
in response to the first adjustment recommendation and each of the at least one additional adjustment recommendations being consistent, issuing the recommendation by the AVS system.

### Claim 2 (depends on 1)

The method of claim 1, wherein the recommendation is issued in response to the first adjustment recommendation and each of the at least one additional adjustment recommendations corresponding to a voltage increase.

### Claim 3 (depends on 1)

The method of claim 1, wherein the recommendation is issued in response to the first adjustment recommendation and each of the at least one additional adjustment recommendations corresponding to a voltage decrease.

### Claim 4 (depends on 1)

The method of claim 1, wherein the recommendation is issued in response to a threshold number of consecutive iterations having consistent adjustment recommendations, wherein the threshold number is a programmable integer value greater than one.

### Claim 5 (depends on 1)

The method of claim 1, wherein a time interval between iterations is programmable.

### Claim 6 (depends on 1)

The method of claim 1, wherein the AVS operation is performed by an AVS system that includes multiple sensors coupled to an AVS controller.

### Claim 7 (depends on 6)

The method of claim 6, wherein the AVS system is programmable to select between sampling techniques including serial sensor sampling and parallel sensor sampling and to perform a selected sampling technique during each iteration.

### Claim 8 (depends on 1)

The method of claim 1, wherein the recommendation is issued to a voltage regulator.

### Claim 9 (depends on 8)

The method of claim 8, wherein the AVS operation is performed by an AVS system on a first die, and wherein the voltage regulator is implemented at a power management integrated circuit (PMIC) on a second die that is distinct from the first die.

### Claim 10 (depends on 9)

The method of claim 9, wherein a time interval between iterations of the AVS operation is longer than a transient of a power change of the PMIC.

### Claim 11 (depends on 9)

The method of claim 9, wherein multiple AVS systems are implemented on the first die.

### Claim 12 (depends on 1)

The method of claim 1, wherein the first adjustment recommendation and the at least one additional adjustment recommendation are based on at least one of: an operating condition of the semiconductor device, a temperature of the semiconductor device, or a performance of the semiconductor device.

### Claim 13

An apparatus comprising:
an adaptive voltage scaling (AVS) system comprising:
multiple sensors configured to sample characteristics of a semiconductor device; and
a controller coupled to the sensors and configured to determine an adjustment recommendation for each iteration of an AVS operation that includes sampling the characteristics,
wherein the controller is further configured to issue a recommendation in response to a threshold number of consecutive adjustment recommendations being consistent.

### Claim 14 (depends on 13)

The apparatus of claim 13, wherein the recommendation is issued in response to the threshold number of consecutive adjustment recommendations indicating a voltage increase.

### Claim 15 (depends on 13)

The apparatus of claim 13, wherein the recommendation is issued in response to the threshold number of consecutive adjustment recommendations indicating a voltage decrease.

### Claim 16 (depends on 13)

The apparatus of claim 13, wherein the threshold number is a programmable integer value greater than one.

### Claim 17 (depends on 13)

The apparatus of claim 13, wherein a time interval between iterations of the AVS operation is programmable.

### Claim 18 (depends on 13)

The apparatus of claim 13, wherein the controller is programmable to select between sampling techniques including serial sensor sampling and parallel sensor sampling and to perform a selected sampling technique during each iteration.

### Claim 19 (depends on 13)

The apparatus of claim 13, further comprising a voltage regulator, wherein the recommendation is issued to the voltage regulator.

### Claim 20 (depends on 19)

The apparatus of claim 19, wherein the AVS system is implemented on a first die, and wherein the voltage regulator is implemented at a power management integrated circuit (PMIC) on a second die that is distinct from the first die.

### Claim 21 (depends on 20)

The apparatus of claim 20, wherein a time interval between iterations of the AVS operation is longer than a transient of a power change of the PMIC.

### Claim 22 (depends on 20)

The apparatus of claim 20, further comprising at least one additional AVS system implemented on the first die.

### Claim 23 (depends on 13)

The apparatus of claim 13, wherein the adjustment recommendation is based on at least one of: an operating condition of the semiconductor device, a temperature of the semiconductor device, or a performance of the semiconductor device.

### Claim 24

An apparatus comprising:
means for sampling characteristics of a semiconductor device;
means for determining an adjustment recommendation for each iteration of an adaptive voltage scaling (AVS) operation that includes sampling the characteristics; and
means for issuing a recommendation in response to a threshold number of consecutive adjustment recommendations being consistent.

### Claim 25 (depends on 24)

The apparatus of claim 24, wherein the recommendation is issued in response to the threshold number of consecutive adjustment recommendations indicating a voltage increase.

### Claim 26 (depends on 24)

The apparatus of claim 24, wherein the recommendation is issued in response to the threshold number of consecutive adjustment recommendations indicating a voltage decrease.

### Claim 27 (depends on 24)

The apparatus of claim 24, wherein the threshold number is an integer value greater than one that is set via a means for programming.

### Claim 28 (depends on 24)

The apparatus of claim 24, wherein a time interval between iterations is set via a means for programming.

### Claim 29 (depends on 24)

The apparatus of claim 24, wherein the means for sampling is programmable to select between sampling techniques including serial sensor sampling and parallel sensor sampling and to perform a selected sampling technique during each iteration.

### Claim 30 (depends on 24)

The apparatus of claim 24, further comprising means for regulating voltage, wherein the recommendation is issued to the means for regulating voltage.

### Claim 31 (depends on 30)

The apparatus of claim 30, wherein the means for sampling, the means for determining, and the means for issuing are implemented on a first die, and wherein the means for regulating voltage is implemented at a power management integrated circuit (PMIC) on a second die that is distinct from the first die.

### Claim 32 (depends on 31)

The apparatus of claim 31, wherein a time interval between iterations is longer than a transient of a power change of the PMIC.

### Claim 33 (depends on 31)

The apparatus of claim 31, further comprising at least one additional means for sampling, at least one additional means for determining, and at least one additional means for issuing are implemented on the first die.

### Claim 34 (depends on 24)

The apparatus of claim 24, wherein the adjustment recommendation is based on at least one of: an operating condition of the semiconductor device, a temperature of the semiconductor device, or a performance of the semiconductor device.

### Claim 35

A computer-readable storage device comprising instructions that, when executed by a processor, cause the processor to:
prior to issuing a recommendation by an adaptive voltage scaling (AVS) system:
perform a first iteration of an AVS operation to sample characteristics of a semiconductor device to determine a first adjustment recommendation; and
perform at least one additional iteration of the AVS operation to determine at least one additional adjustment recommendation; and
in response to the first adjustment recommendation and each of the at least one additional adjustment recommendations being consistent, issue the recommendation by the AVS system.

### Claim 36 (depends on 35)

The computer-readable storage device of claim 35, wherein the recommendation is issued in response to the first adjustment recommendation and each of the at least one additional adjustment recommendations corresponding to a voltage increase.

### Claim 37 (depends on 35)

The computer-readable storage device of claim 35, wherein the recommendation is issued in response to the first adjustment recommendation and each of the at least one additional adjustment recommendations corresponding to a voltage decrease.

### Claim 38 (depends on 35)

The computer-readable storage device of claim 35, wherein the recommendation is issued in response to a threshold number of consecutive iterations having consistent adjustment recommendations, wherein the threshold number is a programmable integer value greater than one.

### Claim 39 (depends on 35)

The computer-readable storage device of claim 35, wherein a time interval between iterations is programmable.

### Claim 40 (depends on 35)

The computer-readable storage device of claim 35, wherein the AVS operation is performed by an AVS system that includes multiple sensors coupled to an AVS controller.

### Claim 41 (depends on 40)

The computer-readable storage device of claim 40, wherein the AVS system is programmable to select between sampling techniques including serial sensor sampling and parallel sensor sampling and to perform a selected sampling technique during each iteration.

### Claim 42 (depends on 35)

The computer-readable storage device of claim 35, wherein the recommendation is issued to a voltage regulator.

### Claim 43 (depends on 42)

The computer-readable storage device of claim 42, wherein the AVS operation is performed by an AVS system on a first die, and wherein the voltage regulator is implemented at a power management integrated circuit (PMIC) on a second die that is distinct from the first die.

### Claim 44 (depends on 43)

The computer-readable storage device of claim 43, wherein a time interval between iterations of the AVS operation is longer than a transient of a power change of the PMIC.

### Claim 45 (depends on 43)

The computer-readable storage device of claim 43, wherein multiple AVS systems are implemented on the first die.

### Claim 46 (depends on 35)

The computer-readable storage device of claim 35, wherein the first adjustment recommendation and the at least one additional adjustment recommendation are based on at least one of: an operating condition of the semiconductor device, a temperature of the semiconductor device, or a performance of the semiconductor device.