# US 2014/0152841 A1 · Method and system for emissivity determination > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2014/0152841 A1 - Document ID: US20140152841A1 - Status: Published application - Kind: A1 - Application number: 14/233,672 - Filed: 2012-07-11 - Published: 2014-06-05 - Earliest claimed: 2011-07-20 - Assignees: Siemens Aktiengesellschaft - Inventors: Max Rothenfusser; Michael Stockmann - Web page: https://patentgrep.com/patent/US20140152841A1 ## CPC - G01J 5/0003: {for sensing the radiant heat transfer of samples, e.g. emittance meter} - G01J 5/0806: Focusing or collimating elements, e.g. lenses or concave mirrors - G01J 5/0831: Masks; Aperture plates; Spatial light modulators - G01J 5/084: {Adjustable or slidable} - G01J 5/0896: {using a light source, e.g. for illuminating a surface} - H04N 23/20: for generating image signals from infrared radiation only - G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N) - H04N: PICTORIAL COMMUNICATION, e.g. TELEVISION ## Abstract A surface of an object is irradiated using an infrared light beam. The infrared light beams reflected at the object are received by an infrared camera which captures a first intensity of the reflected infrared light beams on a detector of the infrared camera. Ambient radiation reflected at the object and the characteristic radiation of the object are detected by capturing a second intensity of the reflected ambient radiation and the characteristic radiation of the object on the detector of the infrared camera. The emissivity of the object is calculated based on the first intensity and the second intensity. ## Claims ### Claim at position 1 1-14. (canceled) ### Claim 15 A method for determining emissivity of an object, comprising: irradiating a surface of the object with an infrared light beam; receiving reflected infrared light beams, reflected at the object, using an infrared camera; acquiring a first intensity of the reflected infrared light beams on a detector of the infrared camera; receiving reflected surrounding radiation reflected at the object and inherent radiation of the object using the infrared camera; acquiring a second intensity of the reflected surrounding radiation and the inherent radiation of the object on the detector of the infrared camera; and calculating the emissivity of the object based on the first intensity and the second intensity. ### Claim 16 (depends on 15) The method as claimed in claim 15, wherein said irradiating the object with the infrared light beam includes focusing infrared radiation emitted by an infrared emitter. ### Claim 17 (depends on 16) The method as claimed in claim 16, wherein said receiving of the reflected infrared light beams and the reflected surrounding radiation as well as the inherent radiation of the object in each case comprises focusing the reflected infrared light beams on the detector with the aid of a lens device. ### Claim 18 (depends on 17) The method as claimed in claim 17, furthermore comprising setting the focal point of the lens device on the surface of the object. ### Claim 19 (depends on 18) The method as claimed in claim 18, wherein said acquiring the first intensity and said acquiring the second intensity each comprises integrating a received intensity over an acquisition area of the detector. ### Claim 20 (depends on 19) The method as claimed in claim 19, further comprising: wavelength-dependent filtering of the reflected infrared light beams with the aid of a filter device of the infrared camera; and wavelength-dependent filtering of the reflected surrounding radiation and the inherent radiation of the object with the aid of the filter device. ### Claim 21 A device for determining emissivity of an object using an infrared camera, comprising: an emitter device, including: an infrared emitter, which emits infrared light beams over a predetermined wavelength range, and an aperture stop, which is configured to focus at least some of the infrared light beams emitted by the infrared emitter into a substantially parallel light beam and to transmit the substantially parallel light beam to a surface of the object; and an evaluation apparatus with a control apparatus, coupled to said emitter device and the infrared camera, the control apparatus configured to actuate the infrared camera in acquiring an intensity of the substantially parallel light beam reflected from the surface of the object and to synchronize emission of the infrared light beams by the infrared emitter with the acquiring of the intensity by the infrared camera. ### Claim 22 (depends on 21) The device as claimed in claim 21, wherein said evaluation device comprises a calculation apparatus, configured to calculate the emissivity of the object based on the intensity acquired by the infrared camera. ### Claim 23 (depends on 22) The device as claimed in claim 22, wherein said calculation apparatus has a lock-in amplifier, and wherein the control apparatus is configured to control the emission of the infrared light beams by said infrared emitter with a clock of a reference frequency. ### Claim 24 A system for determining emissivity of an object, comprising: an infrared camera, including a detector acquiring intensity of infrared light beams received by said camera; an emitter device, including: an infrared emitter, which emits the infrared light beams over a predetermined wavelength range, and an aperture stop, which is configured to focus at least some of the infrared light beams emitted by the infrared emitter into a substantially parallel light beam and to transmit the substantially parallel light beam to a surface of the object; and an evaluation apparatus with a control apparatus, coupled to said emitter device and said infrared camera, the control apparatus configured to actuate said infrared camera in acquiring an intensity of the substantially parallel light beam reflected from the surface of the object and to synchronize emission of the infrared light beams by the infrared emitter with the acquiring of the intensity by said infrared camera. ### Claim 25 (depends on 24) The system as claimed in claim 24, wherein said evaluation device comprises a calculation apparatus, configured to calculate the emissivity of the object based on the intensity acquired by the infrared camera by integrating the acquired intensity over an acquisition area of the detector. ### Claim 26 (depends on 25) The system as claimed in claim 25, wherein said infrared camera includes a lens device which has a front focal point on the surface of the object and is configured to image the infrared light beams emitted the infrared emitter and reflected at the surface of the object, at infinity on an acquisition area of the detector. ### Claim 27 (depends on 26) The system as claimed in claim 26, wherein the detector is arranged in a rear focal point of the lens device. ### Claim 28 (depends on 27) The system as claimed in claim 27, wherein the infrared camera includes a filter device configured to filter reflected infrared light beams, acquired by the detector, in a wavelength-dependent manner.