# US 2014/0152344 A1 · In situ pulse-based delay variation monitor predicting timing error caused by process and environmental variation

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- Number: US 2014/0152344 A1
- Document ID: US20140152344A1
- Status: Published application
- Kind: A1
- Application number: 14/069,732
- Filed: 2013-11-01
- Published: 2014-06-05
- Earliest claimed: 2012-12-04
- Assignees: National Cheng Kung University
- Applicants: National Cheng Kung University
- Inventors: LIH-YIH CHIOU; CHI-RAY HUANG; MING-HUNG WU
- Web page: https://patentgrep.com/patent/US20140152344A1

## CPC

- H03K 19/00369: {Modifications for compensating variations of temperature, supply voltage or other physical parameters}
- H03K 19/0963: {using transistors of complementary type (H03K19/0966 takes precedence)}
- H03K: PULSE TECHNIQUE (measuring pulse characteristics G01R; modulating sinusoidal oscillations with pulses H03C; transmission of digital information H04L; discriminator circuits detecting phase difference between two signals by counting or integrating cycles of oscillation H03D3/04; automatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses where the type of generator is irrelevant or unspecified H03L; coding, decoding or code conversion, in general H03M)

## Abstract

An in situ pulse-based delay variation monitor that predicts timing errors caused by process and environmental variations is revealed. The monitor includes a sequential storage device having a mater storage device and a slave storage device, a transition detector that is electrically connected to a node set on an electrical connection pathway from a master storage device to the slave storage device, and a warning signal generator electrically connected to the transition detector. The transition detector receives output of the master storage device to form a warning area by delay buffer, and generates a pulse width output correspondingly according to transition of the data input. Thus the warning signal generator generates a warning signal according to logic action at the pulse width and the clock input when the data input reaches the warning area. Thereby timing errors caused by static process variations and dynamic environmental variations are predicted.

## Claims

### Claim 1

An in situ pulse-based delay variation monitor that predicts timing errors caused by process and environmental variations comprising:
a sequential storage device having a master storage device receiving a clock input and a slave storage device; the master storage device having a data input and the slave storage device having a data output; a node is set on an electrical connection from the master storage device to the slave storage device;
a transition detector that is electrically connected to the node for receiving the data output of the master storage device to form a warning area by delay buffer and generate a pulse width output correspondingly according to transition of the data input; and
a warning signal generator that is electrically connected to the transition detector; the warning signal generator produce a warning signal according to logic action of the pulse width and the clock input when the data input arrives the warning area.

### Claim 2 (depends on 1)

The device as claimed in claim 1, wherein the transition detector includes a delay unit electrically connected to the node for forming the warning area and a pulse width generating unit electrically connected to the node and the delay unit respectively; the pulse width generating unit receives output of the warning area and data transmitted from the master storage device so as to output the pulse width.

### Claim 3 (depends on 2)

The device as claimed in claim 2, wherein the delay unit includes at least one buffer.

### Claim 4 (depends on 3)

The device as claimed in claim 3, wherein the delay unit includes at least two buffers; each of two buffers is connected to a multiplexer so that the delay unit is able to adjust width of the warning area.

### Claim 5 (depends on 2)

The device as claimed in claim 2, wherein the pulse width generating unit is an exclusive OR (XOR) gate.

### Claim 6 (depends on 1)

The device as claimed in claim 1, wherein the warning signal generator includes a first dynamic AND gate and a first inverter for receiving output of the first dynamic AND gate.

### Claim 7 (depends on 6)

The device as claimed in claim 6, wherein the first dynamic AND gate is a domino logic circuit.

### Claim 8 (depends on 1)

The device as claimed in claim 1, wherein the sequential storage device is a latch or a flip-flop.

### Claim 9 (depends on 1)

The device as claimed in claim 1, further includes a clock gating controller for respectively receiving the clock input and the pulse width, and a latch for receiving output of the clock gating controller and the data input; the clock gating controller performs clock gate control of the clock input by the pulse width to extend access time of the latch and output of the master storage device and output of the latch are compared by a logic action to generate an error signal.

### Claim 10 (depends on 9)

The device as claimed in claim 9, wherein the clock gating controller includes a second dynamic AND gate that receives the clock input, a second inverter that receives the pulse width and outputs to the second dynamic AND gate, and a third inverter that receives output of the second dynamic AND gate and outputs to the latch.

### Claim 11 (depends on 9)

The device as claimed in claim 9, wherein in the logic action, an exclusive OR (XOR) gate is used to receive output of the master storage device and output of the latch.
