# US 2014/0152199 A1 · Particle beam system and pattern data generation method for particle beam system > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2014/0152199 A1 - Document ID: US20140152199A1 - Status: Published application - Kind: A1 - Application number: 14/090,765 - Filed: 2013-11-26 - Published: 2014-06-05 - Earliest claimed: 2012-12-03 - Assignees: Hitachi, Ltd. - Applicants: Hitachi, Ltd. - Inventors: Haruki ARITA; Moemi TAKEDA - Web page: https://patentgrep.com/patent/US20140152199A1 ## CPC - H05H 13/04: Synchrotrons - H05H 7/04: Magnet systems {, e.g. undulators, wigglers (free-electron laser H01S3/0903)}; Energisation thereof - H05H 2007/008: {for measuring beam parameters} - H05H: PLASMA TECHNIQUE (apparatus or processes specially adapted for producing X-rays H05G2/00); PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS ## Abstract To reduce the number of steps of generating control pattern data needed for achieving beam irradiation with desired energy in the beam extraction from a synchrotron accelerator, a data generator 41 divides adjusted control pattern data, defines the divided data intervals as data modules, and reuses each of the data modules to generate new control pattern data. For extraction energy level changes, which are characteristic of multi-energy extraction, energy change control pattern data is generated based on the extraction pattern data before an energy level change and the extraction pattern data after the energy level change by using an interpolation function thereby to allow the control pattern data to be automatically generated. Effects of residual magnetic fields are calculated in advance, and then adjustment values that allow for the effects of the residual magnetic fields are incorporated into the control pattern data and operation is controlled. ## Claims ### Claim 1 A particle beam system, comprising: a synchrotron accelerator constructed to accelerate and extract an ionized particle beam; a controller configured to control devices constituting the synchrotron accelerator; and a data generator configured to: generate a plurality of adjusted data modules including acceleration pattern data, extraction pattern data, and deceleration pattern data, by dividing adjusted control pattern data used to control the devices constituting the synchrotron accelerator; and combine the plurality of adjusted data modules to generate new control pattern data used for the controller. ### Claim 2 (depends on 1) The particle beam system according to claim 1, wherein: the new control pattern data generated by combining the data modules contains multi-energy extraction pattern data including a plurality of sets of extraction pattern data different in extraction energy level value; and the data generator generates energy change pattern data necessary for the multi-energy extraction pattern data, by interpolating extraction pattern data before an energy level change, and extraction pattern data after the energy level change, by use of an interpolation function. ### Claim 3 (depends on 2) The particle beam system according to claim 2, wherein: the data generator generates, as the new control pattern data, the multi-energy extraction pattern data and deceleration control pattern data which corresponds to those extraction energy level values of extraction control pattern data that are other than a final energy level value included in the multi-energy extraction pattern data. ### Claim 4 (depends on 2) The particle beam system according to claim 2, wherein: the data generator stores, in association with extraction energy and extraction levels, a plurality of adjustment values each for adjusting magnetic field residues occurring in the devices after the beam extraction from the synchrotron accelerator, and the data generator conducts residual magnetic field adjustments using the adjustment values when the new control pattern data is generated. ### Claim 5 (depends on 4) The particle beam system according to claim 4, wherein: the data generator acquires part of the adjustment values by measurement, and calculates the remaining adjustment values by interpolating the adjustment values that have been acquired by the measurement. ### Claim 6 (depends on 1) The particle beam system according to claim 1, further comprising: a data storage device with a plurality of sets of adjusted control pattern data saved therein, wherein the data generator generates the plurality of adjusted data modules by selecting, from the plurality of sets of adjusted control pattern data, the corresponding sets of adjusted control pattern data that is required for treatment and dividing the selected sets of adjusted control pattern data. ### Claim 7 (depends on 2) The particle beam system according to claim 2, further comprising: a data storage device with a plurality of sets of adjusted control pattern data saved therein, wherein the data generator generates the plurality of adjusted data modules by selecting, from the plurality of sets of adjusted control pattern data, the corresponding sets of adjusted control pattern data that is required for treatment and dividing the selected sets of adjusted control pattern data. ### Claim 8 A method of generating control pattern data for a particle beam system including a synchrotron accelerator constructed to accelerate and extract an ionized particle beam, and a controller configured to control devices constituting the synchrotron accelerator, the control pattern data being used for the controller to control the devices constituting the synchrotron accelerator, the method comprising: generating a plurality of adjusted data modules including acceleration pattern data, extraction pattern data, and deceleration pattern data, by dividing adjusted control pattern data used to control the devices constituting the synchrotron accelerator; and combining the plurality of adjusted data modules to generate new control pattern data used for the controller. ### Claim 9 (depends on 8) The method of generating control pattern data according to claim 8, wherein: the new control pattern data generated by combining the data modules contains multi-energy extraction pattern data including a plurality of sets of extraction pattern data different in extraction energy level value; and energy change pattern data necessary for the multi-energy extraction pattern data is generated by interpolating extraction pattern data obtained before an energy level change, and extraction pattern data obtained after the energy level change, by use of an interpolation function. ### Claim 10 (depends on 8) The method of generating control pattern data according to claim 8, further comprising: generating, as the new control pattern data, the multi-energy extraction pattern data and deceleration control pattern data which corresponds to those extraction energy level values of extraction control pattern data that are other than a final energy level value included in the multi-energy extraction pattern data. ### Claim 11 (depends on 9) The method of generating control pattern data according to claim 9, further comprising: storing, in association with extraction energy and extraction levels, a plurality of adjustment values each for adjusting magnetic field residues occurring in the devices after the beam extraction from the synchrotron accelerator; and conducting residual magnetic field adjustments using the adjustment values when the new control pattern data is generated. ### Claim 12 (depends on 11) The method of generating control pattern data according to claim 11, further comprising: acquiring part of the adjustment values by measurement; and calculating the remaining adjustment values by interpolating the adjustment values that have been acquired by the measurement. ### Claim 13 (depends on 8) The method of generating control pattern data according to claim 8, further comprising: saving a plurality of sets of adjusted control pattern data in a data storage device; and generating the plurality of adjusted data modules by selecting, from the plurality of sets of adjusted control pattern data, the corresponding sets of adjusted control pattern data that is required for treatment and dividing the selected sets of adjusted control pattern data. ### Claim 14 (depends on 9) The method of generating control pattern data according to claim 9, further comprising: saving a plurality of sets of adjusted control pattern data in a data storage device; and generating the plurality of adjusted data modules by selecting, from the plurality of sets of adjusted control pattern data, the corresponding sets of adjusted control pattern data that is required for treatment and dividing the selected sets of adjusted control pattern data.