# US 2014/0151684 A1 · X-ray detector > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2014/0151684 A1 - Document ID: US20140151684A1 - Status: Published application - Kind: A1 - Application number: 14/084,878 - Filed: 2013-11-20 - Published: 2014-06-05 - Earliest claimed: 2012-12-03 - Assignees: Innolux Corporation - Applicants: InnoLux Corporation - Inventors: Chih-Hao WU - Web page: https://patentgrep.com/patent/US20140151684A1 ## CPC - H10D 86/60: wherein the TFTs are in active matrices - G01T 1/241: {Electrode arrangements, e.g. continuous or parallel strips or the like} - H10D 86/423: {comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO} - H10D 86/441: {Interconnections, e.g. scanning lines} - H10F 30/301: {the devices being sensitive to very short wavelength, e.g. being sensitive to X-rays, gamma-rays or corpuscular radiation} - H10F 39/1898: {Indirect radiation image sensors, e.g. using luminescent members} - H10F 39/802: {Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes} - H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES - G01T: MEASUREMENT OF NUCLEAR OR X-RADIATION (radiation analysis of materials, mass spectrometry G01N23/00; tubes for determining the presence, intensity, density or energy of radiation or particles H01J47/00) - H10F: INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION ## Abstract An X-ray detector including a thin film transistor (TFT) substrate and a photo-diode array layer is disclosed. Each thin film transistor in the TFT substrate includes: a substrate; a gate-electrode on the substrate; a gate insulating layer on the gate-electrode; a semiconductor layer on the gate insulating layer, wherein a portion of the semiconductor layer covers the gate-electrode; an etching stop layer covering the semiconductor layer; a source-electrode and a drain-electrode respectively disposed on the etching stop layer, wherein the source-electrode and the drain-electrode are respectively electrically connected to the semiconductor layer through conductive via-holes each having a base portion at the semiconductor layer, and at least one of the projection areas of the base portions vertically projected on the substrate has a non-overlapping region beyond the projection area of the gate-electrode vertically projected on the substrate; and a passivation layer covering the source-electrode and the drain-electrode. ## Claims ### Claim 1 An X-ray detector, comprising: a thin film transistor substrate, which comprises a substrate, a plurality of data lines and a plurality of gate lines intersected to define a plurality of pixel regions, wherein each of the pixel regions comprises at least one thin film transistor, and the thin film transistor comprises: a gate electrode, disposed on the substrate; a gate insulating layer, disposed on the gate electrode; a semiconductor layer, disposed on the gate insulating layer, wherein a portion of the semiconductor layer covers the gate electrode; an etching stop layer, disposed on the semiconductor layer; a source electrode and a drain electrode, respectively disposed on the etching stop layer; a passivation layer, covering the source electrode and the drain electrode; and a photo-diode array layer, having plurality of photo-diodes electrically connected to the corresponding thin film transistor; wherein the source electrode is electrically connected to the semiconductor layer through a first conductive via hole having a first base portion at the semiconductor layer, the drain electrode is electrically connected to the semiconductor layer through a second conductive via hole having a second base portion at the semiconductor layer, and at least one of projection areas of the first base portion and the second base portion vertically projected on the substrate has a non-overlapping region beyond a projection area of the gate electrode vertically projected on the substrate. ### Claim 2 (depends on 1) The X-ray detector of claim 1, wherein the semiconductor layer is a metal oxide semiconductor layer whose material comprises indium zinc oxide (InZnO, IZO). ### Claim 3 (depends on 1) The X-ray detector of claim 1, wherein the semiconductor layer is a metal oxide semiconductor layer whose material comprises indium gallium zinc oxide (InGaZnO, IGZO). ### Claim 4 (depends on 1) The X-ray detector of claim 1, wherein at least one of the projection areas of the first base portion and the second base portion vertically projected on the substrate and the projection area of the gate electrode vertically projected on the substrate have an overlapping region with a width of 1 μm or more, which is smaller than a width of the projection area of the first base portion or the second base portion vertically projected on the substrate. ### Claim 5 (depends on 1) The X-ray detector of claim 1, wherein the drain electrode is further electrically connected to the data line through a third conductive via hole. ### Claim 6 (depends on 1) The X-ray detector of claim 1, further comprising a scintillator layer and a reflective layer over the photo-diode array layer, wherein the scintillator layer is disposed on the photo-diode array layer, and the reflective layer is disposed on the scintillator layer. ### Claim 7 An X-ray detector, comprising: a thin film transistor substrate, which comprises a substrate, a plurality of data lines and a plurality of gate lines intersected to define a plurality of pixel regions, wherein each of the pixel regions comprises at least one thin film transistor, and the thin film transistor comprises: a gate electrode, disposed on the substrate; a gate insulating layer, disposed on the gate electrode; a semiconductor layer, disposed on the gate insulating layer, wherein a width of a projection area of the semiconductor layer vertically projected on the gate electrode has been smaller than a width of a projection area of the gate electrode vertically projected on the substrate; an etching stop layer, disposed on the semiconductor layer; a source electrode and a drain electrode, respectively disposed on the etching stop layer; a passivation layer, covering the source electrode and the drain electrode; and a photo-diode array layer, having a plurality of photo-diodes electrically connected to the corresponding thin film transistor; wherein the source electrode is electrically connected to the semiconductor layer through a first conductive via hole having a first base portion at the semiconductor layer, the drain electrode is electrically connected to the semiconductor layer through a second conductive via hole having a second base portion at the semiconductor layer, and at least one of projection areas of the first and second base portions vertically projected on the substrate has a non-overlapping region beyond a projection area of the semiconductor layer vertically projected on the substrate. ### Claim 8 (depends on 7) The X-ray detector of claim 7, wherein at least one of the projection areas of the first base portion and the second base portion vertically projected on the substrate and the projection area of the semiconductor layer vertically projected on the substrate have an overlapping region with a width of 1 μm or more, which is smaller than a width of a projection area of the first base portion or the second base portion vertically projected on the gate insulating layer. ### Claim 9 (depends on 7) The X-ray detector of claim 7, wherein the semiconductor layer is a metal oxide semiconductor layer whose material comprises indium zinc oxide (InZnO, IZO) ### Claim 10 (depends on 7) The X-ray detector of claim 7, wherein the semiconductor layer is a metal oxide semiconductor layer whose material comprises indium gallium zinc oxide (InGaZnO, IGZO). ### Claim 11 (depends on 7) The X-ray detector of claim 7, further comprising a scintillator layer and a reflective layer over the photo-diode array layer, wherein the scintillator layer is disposed on the photo-diode array layer, and the reflective layer is disposed on the scintillator layer. ### Claim 12 (depends on 7) The X-ray detector of claim 7, wherein the drain electrode is further electrically connected to the data line through a third conductive via hole.