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US 2014/0131574 A1Published application
Control imaging methods in advanced ultrafast electron microscopy
AssigneeCalifornia Institute of Technology
InventorsAhmed H. Zewail, John Spencer Baskin
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Abstract
An optical system includes a beam splitter disposed along an optical axis and a set of mirrors optically coupled to the beam splitter. The set of mirrors are oriented perpendicular to each other. The optical system also includes a turning mirror optically coupled to a second mirror of the set of mirrors and a detector optically coupled to the turning mirror.
Claims17
A microscope system comprising:
- a microscope column;
- an electron beam path disposed within the microscope column, wherein the electron beam path impinges on a specimen disposed in the microscope column;
- a laser beam path operable to support a laser beam and disposed both external to and within the microscope column, wherein the laser beam path impinges on the specimen;
- a beam splitter disposed along the laser beam path and operable to split the laser beam into a specimen path and a detection path;
- a set of mirrors disposed along the detection path and optically coupled to the beam splitter, wherein the set of mirrors are oriented perpendicular to each other;
- a turning mirror disposed along the detection path and optically coupled to a second mirror of the set of mirrors;
- and
- a detector optically coupled to the turning mirror.
5 more elements
A microscope system comprising:
- a microscope column;
- a laser system operable to provide a laser beam;
- an electron beam path disposed within the microscope column;
- a window disposed in the microscope column;
- a laser beam path disposed within the microscope column, wherein both the electron beam path and the laser beam path impinge on a specimen disposed in the microscope column at a predetermined position;
- an optical system mounted in a fixed relationship to the window, wherein the optical system comprises:
- a beam splitter operable to receive the laser beam, pass a first portion of the laser beam to the laser beam path, and pass a second portion of the laser beam along a detection path;
- a set of mirrors disposed along the detection path and operable to receive the second portion of the laser beam;
- a turning mirror disposed along the detection path and coupled to the set of mirrors;
- and
- a detector, wherein the detection path impinges on the detector at a second predetermined position correlated to the predetermined position.
8 more elements
A method of imaging a specimen, the method comprising:
- providing a stage assembly configured to support the specimen;
- generating a first train of optical pulses from a first laser source;
- directing the first train of optical pulses along an optical path to impinge on a cathode;
- generating a train of electron pulses in response to the first train of optical pulses impinging on the cathode;
- directing the train of electron pulses along an imaging path to impinge on the specimen;
- generating a second train of optical pulses from a second laser source;
- splitting the second train of optical pulses into a specimen path and a detection path, wherein the specimen path and the detection path have equal optical path lengths;
- directing the optical pulses in the specimen path to impinge on the specimen;
- directing the optical pulses in the detection path to impinge on a detector after reflection from a set of mirrors and a turning mirror;
- and
- detecting at least a portion of the train of electron pulses passing through the specimen.
8 more elements
Dependencies are inferred from the claim text.