Method for x-ray phase contrast and dark-field imaging using an arrangement of gratings in planar geometry

An X-ray arrangement for obtaining quantitative X-ray images from a sample, comprising:

• a) an X-ray source (x-ray);
• b) a set of at least two gratings (G0, G1 and G2 and G1, G2 resp.);
• c) a position-sensitive detector (PSD) with spatially modulated detection sensitivity having a plurality of individual pixels;
• d) a recorder connected to said detector (PSD) for recording images of said detector (PSD);
• e) evaluation means for evaluating respective intensities for each pixel in a series of images in order to identify a characteristic of the object for each individual pixel as one or more of an absorption-dominated pixel or a differential phase contrast dominated pixel or an x-ray scattering dominated pixel;
• f) wherein the series of images is collected by continuously or stepwise rotating from 0 to π or 2π either the sample or the X-ray source relative to the sample;
• g) said set of gratings (G0 (if required), G1 and G2), or part of said gratings being manufactured with novel planar geometry where the X-rays pass through said gratings parallel to the substrate;
• h) said grating structures extending along the x-ray path which determines the phase shift and attenuation that said grating structures cause to the x-rays, being no longer given by the thickness of said structures, but by a length of said grating structures.