Variable resistance nonvolatile memory device and method of writing thereby
AssigneePanasonic Corporation
InventorsAkifumi Kawahara, Ryotaro Azuma, Kazuhiko Shimakawa, Kouhei Tanabe
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AssigneePanasonic Corporation
InventorsAkifumi Kawahara, Ryotaro Azuma, Kazuhiko Shimakawa, Kouhei Tanabe
Estimating the term…
Provided is a variable resistance nonvolatile memory device that achieves, in multi-bit simultaneous writing for increasing a writing speed, writing with little variation caused by positions of memory cells in multi-bit simultaneous writing. The variable resistance nonvolatile memory device includes bit lines, word lines, memory cells, a first write circuit (e.g., a write circuit (60-0)), a second write circuit (e.g., a write circuit (60-k−1)), a first selection circuit (e.g., a selection circuit (S0—0)), a second selection circuit (e.g., a selection circuit (S0—k−1)), and a first word line drive circuit (a word line drive circuit (40-1)), wherein the first selection circuit (e.g., an NMOS transistor (TS0—0—0 to TS0—0—m−1) included in the selection circuit) has a greater ON resistance than the second selection circuit (e.g., an NMOS transistor (TS0—k−1—0 to TS0—k−1—m−1) included in the selection circuit) does.
A variable resistance nonvolatile memory device comprising:
A method for calculating an ON resistance of a selection circuit in a variable resistance nonvolatile memory device, the method comprising,
A variable resistance nonvolatile memory device comprising:
Dependencies are inferred from the claim text.