Wide field microscope and method for wide field microscopy
AssigneeCarl Zeiss Microscopy GmbH
InventorsThomas Kalkbrenner, Ralf Wolleschensky, Ingo Kleppe
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Abstract
A method for high-resolution PAL microscopy, wherein a sample field is imaged on a detector surface of a detector, the sample field is imaged into an image field which is smaller than the detector surface, and the image field on the detector surface is shifted, so that the same sample field is imaged in different positions located adjacent to one another on the image field in order to determine information about changes in the sample field.
Claims20
A method of PAL microscopy comprising:
- imaging a sample field onto a radiation-sensitive detector surface of a spatially-resolving detector,
- the shifting image field being smaller than the detector surface;
- and
- shifting the image field over the detector surface, with the result that the same sample field is imaged in different, adjacent positions of the image field in order to determine information about changes in the sample field.
A wide-field microscope for high-resolution PAL microscopy, comprising a spatially-resolving detector which includes a radiation-sensitive detector surface, an imaging lens system which images a sample field onto the detector surface of the detector, and a control device which reads out detection data of the detector, wherein the imaging lens system images the sample field into an image field which is smaller than the detector surface, and comprises a controllable scanning device to shift a position of the image field on the detector surface, wherein the control device controls the scanning device such that the same sample field is imaged in different, adjacent positions of the image field, and an item of information about changes in the sample field is determined on the basis of the detection data read out.
Dependencies are inferred from the claim text.