Contact spring for a testing base for the high current testing of an electronic component

A contact spring for a testing base for the current testing, in particular high current testing, of an electronic component, which is produced from a spring metal sheet of a predetermined thickness and possesses two, in particular identical, opposing lateral faces, and which has one spring arm and one testing arm with a testing tip, wherein the testing arm forms an angle with the spring arm, which enables the testing tip to be positioned on a contact surface of the electronic component running approximately parallel to the spring arm, by means of a relative movement between the testing base and the electronic component, characterized in that, the geometry of the lateral faces fulfils the following conditions:

• a dimension L of the distance between a point Po and a point Pu is at least 2.3 times a length L1
• the point Po is located on the boundary line of the lateral face facing towards the electronic component, and comprises a distance from the testing tip of 3 to 5 times, in particular 4 times, the length L1
• the point Po forms the apex of an angle in a range between 120° and 150°, in particular of a 135° angle, the one leg of which extends in the direction of the relative movement between the testing base and the electronic component towards the electronic component, and the other leg of which cuts the boundary line of the lateral face facing away from the electronic component at the point Pu
• the length L1 corresponds to the minimum thickness of the spring arm, as viewed in the direction of the relative movement between testing base and electronic component.