Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing method

An electronic component handling apparatus, comprising:

• a contact arm which includes a holding part holding an electronic component and includes an adjustment unit moving the holding part relative to a base part of the contact arm;
• an imaging unit which images the electronic component and the holding part;
• and
• an operation unit which operates the adjustment unit,
• wherein the imaging unit includes:
• a single imaging device;
• and
• a switching device which switches a direction of an optical axis of the imaging device to a direction toward the electronic component or the holding part, and
• the adjustment unit adjusts a relative position of the holding part with respect to the base part according to an operation of the operation unit.

An electronic component testing method, comprising:

• (a) holding electronic components using holding parts of a plurality of contact arms;
• (b) sequentially acquiring first image information by sequentially imaging a plurality of the electronic components held by the holding parts;
• (c) sequentially positioning the electronic components held by the holding parts with respect to sockets on the basis of the first image information;
• and
• (d) pressing the plurality of electronic components against the sockets using the plurality of contact arms.