Die, Chip, Method for Driving a Die or a Chip and Method for Manufacturing a Die or a Chip
AssigneeInfineon Technologies AG
InventorsPeter Laackmann, Marcus Janke
Life of this patent
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Abstract
In various embodiments, a die is provided. The die may include a physical unclonable function circuit configured to provide an output signal, wherein the output signal is dependent on at least one physical characteristic specific to the die; and a self-test circuit integrated with the physical unclonable function circuit on the die, wherein the self-test circuit is configured to provide at least one test input signal to the physical unclonable function circuit and to determine as to whether the output signal provided in response to the at least one test input signal fulfills a predefined criterion.
Claims28
A die, comprising:
- a physical unclonable function circuit configured to provide an output signal, wherein the output signal is dependent on at least one physical characteristic specific to the die;
- a self-test circuit integrated with the physical unclonable function circuit on the die, wherein the self-test circuit is configured to provide at least one test input signal to the physical unclonable function circuit and to determine as to whether the output signal provided in response to the at least one test input signal fulfills a predefined criterion.
A chip, comprising:
- a circuit configured to provide an output signal dependent on at least one physical characteristic specific to the manufacturing of the chip;
- a self-test circuit, wherein the self-test circuit is configured to provide at least one test input signal to the circuit and to determine as to whether the output signal provided in response to the at least one test input signal corresponds to a predefined behavior.
Method for manufacturing a die, comprising the steps of:
- providing a physical unclonable function circuit on a substrate and configuring the physical unclonable function circuit such that it is able to provide an output signal, wherein the function is dependent on at least one physical characteristic specific to the die;
- integrating a self-test circuit with the physical unclonable function circuit on the die and configuring the self-test circuit such that it is able to provide at least one test input signal to the physical unclonable function circuit and to determine as to whether the output signal provided in response to the at least one test input signal fulfills a predefined criterion.
Method for manufacturing a chip, comprising the steps of:
- providing a circuit on a substrate and configuring the circuit such that it is able to provide an output signal, wherein the output signal is dependent on at least one physical characteristic specific to the manufacturing of the chip;
- providing a self-test circuit on the substrate and configuring the self-test circuit such that it is able to provide at least one test input signal to the circuit and to determine as to whether the output signal provided in response to the at least one test input signal corresponds to a predefined behavior.
Method for driving a die, comprising the steps of:
- providing at least one test input signal by a self-test circuit to a physical unclonable function circuit, wherein the self-test circuit and the physical unclonable function circuit are integrated on the die,
- providing an output signal in response to the test-input signal by the physical unclonable function circuit, wherein the output signal is dependent on at least one physical characteristic specific to the die;
- and
- determining as to whether the output signal provided in response to the at least one test input signal fulfills a predefined criterion.
Method for driving a chip, comprising the steps of:
- providing at least one test input signal by a self-test circuit to a circuit, wherein the self-test circuit and the circuit are integrated on the chip,
- providing an output signal in response to the test-input signal, wherein the function is dependent on at least one physical characteristic specific to the chip;
- and
- determining as to whether the output signal provided in response to the at least one test input signal corresponds to a predefined behavior.
Dependencies are inferred from the claim text.