Vapor deposition method and vapor deposition apparatus
AssigneeKabushiki Kaisha Toshiba
InventorsYoshiyuki HARADA, Koichi Tachibana, Toshiki Hikosaka, Hajime Nago, Shinya Nunoue
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AssigneeKabushiki Kaisha Toshiba
InventorsYoshiyuki HARADA, Koichi Tachibana, Toshiki Hikosaka, Hajime Nago, Shinya Nunoue
Estimating the term…
According to one embodiment, a vapor deposition method is disclosed for forming a nitride semiconductor layer on a substrate by supplying a group III source-material gas and a group V source-material gas. The method can deposit a first semiconductor layer including a nitride semiconductor having a compositional proportion of Al in group III elements of not less than 10 atomic percent by supplying the group III source-material gas from a first outlet and by supplying the group V source-material gas from a second outlet. The method can deposit a second semiconductor layer including a nitride semiconductor having a compositional proportion of Al in group III elements of less than 10 atomic percent by mixing the group III and group V source-material gases and supplying the mixed group III and group V source-material gases from at least one of the first outlet and the second outlet.
1-20. (canceled)
A vapor deposition apparatus configured to perform vapor deposition of a nitride semiconductor crystal layer on a substrate using a group III source-material gas and a group V source-material gas, the apparatus comprising:
A vapor deposition apparatus configured to perform vapor deposition of a nitride semiconductor crystal layer on a substrate using a group III source-material gas and a group V source-material gas, the apparatus comprising:
A vapor deposition apparatus configured to perform vapor deposition of a nitride semiconductor crystal layer on a substrate using a group III source-material gas and a group V source-material gas, the apparatus comprising:
Dependencies are inferred from the claim text.