Method and apparatus of determining layer direction of multilayer electronic component and method and apparatus of manufacturing series of multilayer electronic components
AssigneeMurata Manufacturing Co., Ltd.
InventorKouki OKAMURA
Life of this patent
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Abstract
A layer direction determining method and layer direction determining apparatus for a multilayer electronic component to accurately determine the layer direction of conductor layers in the multilayer electronic component, and a method and apparatus of manufacturing a series of multilayer electronic components to align the layer direction of the conductor layers in the multilayer electronic components in a certain direction.
Claims23
A layer direction determining method for a multilayer electronic component, the layer direction determining method comprising:
- measuring a value of an amount of infrared energy detected from an area including an observation face where a multilayer electronic component in which conductor layers and non-conductor layers are layered is observed under a measurement condition that is set in advance;
- and
- determining a threshold value corresponding to the measurement condition and comparing the threshold value with the measured value to determine a layer direction of the conductor layers in the multilayer electronic component on the basis of the result of the comparison.
A layer direction determining apparatus for a multilayer electronic component, the layer direction determining apparatus comprising:
- a measuring device acquiring a measured value concerning an amount of infrared energy detected from an area including an observation face where a multilayer electronic component in which conductor layers and non-conductor layers are layered is observed under a measurement condition that is set in advance;
- and
- a determining device setting a threshold value corresponding to the measurement condition and comparing the threshold value with the measured value to determine a layer direction of the conductor layers in the multilayer electronic component on a basis of the result of the comparison.
A method of manufacturing a series of multilayer electronic components housed in a base material including a plurality of housings, the method comprising:
- sorting a plurality of multilayer electronic components the conductor layers in which are determined to have a certain layer direction by measuring a value of an amount of infrared energy detected from an area including an observation face where a multilayer electronic component in which conductor layers and non-conductor layers are layered is observed under a measurement condition that is set in advance;
- determining a threshold value corresponding to the measurement condition and comparing the threshold value with the measured value to determine a layer direction of the conductor layers in the multilayer electronic component on the basis of the result of the comparison;
- and
- housing the plurality of multilayer electronic components sorted in the sorting process in the plurality of housings in a state in which the conductor layers are aligned with the certain layer direction.
An apparatus of manufacturing a series of multilayer electronic components housed in a base material including a plurality of housings, the apparatus comprising:
- a sorting device sorting a plurality of multilayer electronic components the conductor layers in which are determined to have a certain layer direction by a measuring device acquiring a measured value concerning an amount of infrared energy detected from an area including an observation face where a multilayer electronic component in which conductor layers and non-conductor layers are layered is observed under a measurement condition that is set in advance;
- a determining device setting a threshold value corresponding to the measurement condition and comparing the threshold value with the measured value to determine a layer direction of the conductor layers in the multilayer electronic component on a basis of the result of the comparison;
- and
- a housing for housing the plurality of multilayer electronic components sorted by the sorting device in the plurality of housings in a state in which the conductor layers are aligned with the certain layer direction.
Dependencies are inferred from the claim text.