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US 2014/0007308 A1Published application
Scanned Probe Microscopy (SPM) Probe Having Angled Tip
AssigneesCornell University, International Business Machines Corporation
InventorsMark C. Reuter, Brian A. Bryce, Bojan R. Ilic, Sandip Tiwari
Life of this patent
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Abstract
A probe for scanned probe microscopy is provided. The probe includes a cantilever beam and a tip. The cantilever beam extends along a generally horizontal axis. The cantilever beam has a crystal facet surface that is oriented at a tilt angle with respect to the generally horizontal axis. The tip projects outwardly from the crystal facet surface.
Claims15
A probe for scanned probe microscopy, comprising:
- a cantilever beam extending along a generally horizontal axis, the cantilever beam having a crystal facet surface that is oriented at a tilt angle with respect to the generally horizontal axis;
- and
- a tip projecting outwardly from the crystal facet surface.
A probe for scanned probe microscopy, comprising:
- a cantilever beam extending along a generally horizontal axis, the cantilever beam having a crystal facet surface that is oriented at a tilt angle with respect to the generally horizontal axis;
- and
- a tip projecting outwardly from the crystal facet surface, the tip oriented generally orthogonal to the crystal facet surface.
Dependencies are inferred from the claim text.