Semiconductor device including ecc circuit
AssigneeSK hynix Inc.
InventorsHyung Gyun YANG, Hyung Dong LEE, Yong Kee KWON, Young Suk MOON
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Abstract
Disclosed is a semiconductor device including an ECC circuit for improving error correction capability. A semiconductor device in accordance with an embodiment of the present invention includes a memory region configured to include a plurality of banks and a redundancy region within each of the banks and an error check and correction (ECC) region configured to detect an address of the memory region at which an error has occurred and correct a defect of the memory region by replacing the address at which the error has occurred with a redundancy line of the redundancy region based on address information.
Claims14
A semiconductor device, comprising:
- a memory region configured to comprise a plurality of banks and a redundancy region within each of the banks;
- and
- an error check and correction (ECC) region configured to detect an address of the memory region at which an error has occurred and correct a defect of the memory region by replacing the address at which the error has occurred with a redundancy line of the redundancy region based on address information.
A semiconductor device, comprising:
- a memory region configured to comprise a plurality of banks and a redundancy region for repairing memory cells of each of the banks;
- and
- an error check and correction (ECC) region configured to comprise a plurality of fuses, store an address at which an error has occurred, and replace the address at which the error has occurred with a redundancy line of the redundancy region using the fuse, wherein the address is controlled so that a method of storing the address depends on a scheme of the redundancy region irrespective of a number of DQ bits of the memory region when a defect of the memory region is detected.
Dependencies are inferred from the claim text.